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• W2989493908 abstract "demonstrate that it is possible to generate a deterministic test set that detects all the detectable single stuck-at faults in a full- scan circuit such that each test contains a small number of transi- tions from 0 to 1 or from I to 0 when considering consecutive input values. Using this result we show that built-in test-pattern generation for scan circuits can be based on transition probabili- ties instead of probabilities of specific bits in the test set being 0 or I. The resulting approach associates only two parameters with every set of test vectors: an initial value and a transition proba- bility. We demonstrate that this approach is effective in detecting all the detectable single stuck-at faults in benchmark circuits. Categories & Subject Descriptors: B.X.1 Reliability, Testing, and Fault-Tolerance" @default.
• W2989493908 created "2019-11-22" @default.
• W2989493908 creator A5048697611 @default.
• W2989493908 date "2004-01-01" @default.
• W2989493908 modified "2023-09-27" @default.
• W2989493908 title "Scan-BIST Based on Transition Probabilities" @default.
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• W2989493908 hasPublicationYear "2004" @default.
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