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• W2989572288 endingPage "2421" @default.
• W2989572288 startingPage "2417" @default.
• W2989572288 abstract "AlInN/GaN heterostructure field-effect transistors (HFETs) grown on silicon withstand irradiation with 75-MeV sulfur ions up to fluences of $5.5 times 10 ^{13}$ ions/cm2. The static transistor operation characteristics of the devices exhibit a shift of the threshold voltage and a decrease in the saturation and the OFF-state current. Microphotoluminescence spectroscopy reveals a decrease in the electron carrier density in the channel region. Simulations were performed to model the damage caused to the devices assuming the generation of acceptor-like defects upon irradiation. It turns out that the degradation depends on the thickness of the buffer layer. Therefore, we propose the reduction in the thickness of the buffer layer as a way to increase the radiation tolerance of HFETs." @default.
• W2989572288 created "2019-12-05" @default.
• W2989572288 creator A5002294207 @default.
• W2989572288 creator A5006037493 @default.
• W2989572288 creator A5023440183 @default.
• W2989572288 creator A5026759530 @default.
• W2989572288 creator A5031412710 @default.
• W2989572288 creator A5036033886 @default.
• W2989572288 creator A5039624449 @default.
• W2989572288 creator A5049477901 @default.
• W2989572288 creator A5063433012 @default.
• W2989572288 creator A5064421535 @default.
• W2989572288 creator A5071192935 @default.
• W2989572288 date "2019-12-01" @default.
• W2989572288 modified "2023-10-15" @default.
• W2989572288 title "Outstanding Reliability of Heavy-Ion-Irradiated AlInN/GaN on Silicon HFETs" @default.
• W2989572288 cites W1674821110 @default.
• W2989572288 cites W1966370851 @default.
• W2989572288 cites W1976815384 @default.
• W2989572288 cites W1982381330 @default.
• W2989572288 cites W1990040127 @default.
• W2989572288 cites W2008587904 @default.
• W2989572288 cites W2025334554 @default.
• W2989572288 cites W2036672757 @default.
• W2989572288 cites W2067029460 @default.
• W2989572288 cites W2096652287 @default.
• W2989572288 cites W2098289382 @default.
• W2989572288 cites W2135424717 @default.
• W2989572288 cites W2155143395 @default.
• W2989572288 cites W2159551223 @default.
• W2989572288 cites W2166850656 @default.
• W2989572288 cites W2167132349 @default.
• W2989572288 cites W2167800447 @default.
• W2989572288 cites W2207125565 @default.
• W2989572288 cites W2323050638 @default.
• W2989572288 cites W2342932627 @default.
• W2989572288 cites W2553523012 @default.
• W2989572288 cites W2735108280 @default.
• W2989572288 cites W2752472205 @default.
• W2989572288 cites W2769504512 @default.
• W2989572288 cites W2776434456 @default.
• W2989572288 cites W2902062682 @default.
• W2989572288 cites W4251540120 @default.
• W2989572288 doi "https://doi.org/10.1109/tns.2019.2954216" @default.
• W2989572288 hasPublicationYear "2019" @default.
• W2989572288 type Work @default.
• W2989572288 sameAs 2989572288 @default.
• W2989572288 citedByCount "4" @default.
• W2989572288 countsByYear W29895722882021 @default.
• W2989572288 countsByYear W29895722882022 @default.
• W2989572288 crossrefType "journal-article" @default.
• W2989572288 hasAuthorship W2989572288A5002294207 @default.
• W2989572288 hasAuthorship W2989572288A5006037493 @default.
• W2989572288 hasAuthorship W2989572288A5023440183 @default.
• W2989572288 hasAuthorship W2989572288A5026759530 @default.
• W2989572288 hasAuthorship W2989572288A5031412710 @default.
• W2989572288 hasAuthorship W2989572288A5036033886 @default.
• W2989572288 hasAuthorship W2989572288A5039624449 @default.
• W2989572288 hasAuthorship W2989572288A5049477901 @default.
• W2989572288 hasAuthorship W2989572288A5063433012 @default.
• W2989572288 hasAuthorship W2989572288A5064421535 @default.
• W2989572288 hasAuthorship W2989572288A5071192935 @default.
• W2989572288 hasConcept C111337013 @default.
• W2989572288 hasConcept C116915560 @default.
• W2989572288 hasConcept C121332964 @default.
• W2989572288 hasConcept C127413603 @default.
• W2989572288 hasConcept C145148216 @default.
• W2989572288 hasConcept C163258240 @default.
• W2989572288 hasConcept C171250308 @default.
• W2989572288 hasConcept C185544564 @default.
• W2989572288 hasConcept C189278905 @default.
• W2989572288 hasConcept C192562407 @default.
• W2989572288 hasConcept C24326235 @default.
• W2989572288 hasConcept C2778871202 @default.
• W2989572288 hasConcept C2779227376 @default.
• W2989572288 hasConcept C2988362075 @default.
• W2989572288 hasConcept C43214815 @default.
• W2989572288 hasConcept C49040817 @default.
• W2989572288 hasConcept C544956773 @default.
• W2989572288 hasConcept C61696701 @default.
• W2989572288 hasConcept C62520636 @default.
• W2989572288 hasConceptScore W2989572288C111337013 @default.
• W2989572288 hasConceptScore W2989572288C116915560 @default.
• W2989572288 hasConceptScore W2989572288C121332964 @default.
• W2989572288 hasConceptScore W2989572288C127413603 @default.
• W2989572288 hasConceptScore W2989572288C145148216 @default.
• W2989572288 hasConceptScore W2989572288C163258240 @default.
• W2989572288 hasConceptScore W2989572288C171250308 @default.
• W2989572288 hasConceptScore W2989572288C185544564 @default.
• W2989572288 hasConceptScore W2989572288C189278905 @default.
• W2989572288 hasConceptScore W2989572288C192562407 @default.
• W2989572288 hasConceptScore W2989572288C24326235 @default.
• W2989572288 hasConceptScore W2989572288C2778871202 @default.
• W2989572288 hasConceptScore W2989572288C2779227376 @default.
• W2989572288 hasConceptScore W2989572288C2988362075 @default.
• W2989572288 hasConceptScore W2989572288C43214815 @default.
• W2989572288 hasConceptScore W2989572288C49040817 @default.
• W2989572288 hasConceptScore W2989572288C544956773 @default.

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