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- W2989595866 abstract "Transmission electron microscopy (TEM) is used to study dislocations, but image stresses introduced during sample preparation may induce slip, potentially significantly modifying the microstructure. The present study quantifies these effects by simulating sample preparation in Al, Fe, Mg, and Zr using dislocation dynamics. Significant decreases in total density are seen, which average nearly 40% for all four metals. The extent of microstructure loss during sample preparation depends on crystal orientation in the HCP systems, and also exhibits substantial statistical variations between cases." @default.
- W2989595866 created "2019-12-05" @default.
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- W2989595866 date "2020-03-01" @default.
- W2989595866 modified "2023-09-25" @default.
- W2989595866 title "On the use of transmission electron microscopy to quantify dislocation densities in bulk metals" @default.
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- W2989595866 doi "https://doi.org/10.1016/j.scriptamat.2019.11.011" @default.
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