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• W2990957765 abstract "As defects usually limit the exciton diffusion in 2D transition metal dichalcogenides (TMDCs), the interaction knowledge of defects and exciton transport is crucial for achieving efficient TMDC-based devices. A direct visualization of defect-modulated exciton transport is developed in few-layer WS2 by ultrafast transient absorption microscopy. Atomic-scale defects are introduced by argon plasma treatment and identified by aberration-corrected scanning transmission electron microscopy. Neutral excitons can be captured by defects to form bound excitons in 7.75-17.88 ps, which provide a nonradiative relaxation channel, leading to decreased exciton lifetime and diffusion coefficient. The exciton diffusion length of defective sample has a drastic reduction from 349.44 to 107.40 nm. These spatially and temporally resolved measurements reveal the interaction mechanism between defects and exciton transport dynamics in 2D TMDCs, giving a guideline for designing high-performance TMDC-based devices." @default.
• W2990957765 created "2019-12-05" @default.
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• W2990957765 date "2019-11-27" @default.
• W2990957765 modified "2023-10-15" @default.
• W2990957765 title "Direct Visualization of Exciton Transport in Defective Few‐Layer WS ₂ by Ultrafast Microscopy" @default.
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• W2990957765 doi "https://doi.org/10.1002/adma.201906540" @default.
• W2990957765 hasPubMedId "https://pubmed.ncbi.nlm.nih.gov/31773833" @default.
• W2990957765 hasPublicationYear "2019" @default.
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