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- W2991326009 abstract "Surface morphology of size-selected silver nanocluster films grown by dc magnetron sputtering has been investigated by means of an atomic force microscopy (AFM). From the height-height correlation functions ( HHCF) obtained from corresponding AFM images, the scaling exponents are calculated and two types of growth regimes have been observed. In the first regime, the growth exponent is found to be b{eta}1 = 0.27pm0.07 close to the KPZ growth exponent, while in the second growth regime shadowing effect plays dominant role which gives the growth exponent value b{eta}2 = 0.88pm0.28. On the other hand for the whole deposition regime, the roughness exponent value is found to be constant around {alpha}= 0.76pm0.02. UV-vis spectroscopy measurement suggests how the average reflectance of the film surface changes with different growth times." @default.
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- W2991326009 date "2020-06-08" @default.
- W2991326009 modified "2023-09-27" @default.
- W2991326009 title "Surface scaling behaviour of size-selected Ag-nanocluster film growing under subsequent shadowing process" @default.
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- W2991326009 doi "https://doi.org/10.1088/1361-6463/ab87c3" @default.
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