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• W3000220613 abstract "Abstract Chapter 3 deals with inaccuracies in composition measurement by APT in compound semiconductor analysis. The key results here are the demonstration that these biases are related to the surface electrostatic field, the estimation of the detection yields of the different species in GaN and in AlGaN and the interpretation of part of the physical mechanisms leading to the non-detection of certain species. Based on these results, indications for the achievenemt of accurate composition measurements can be given." @default.
• W3000220613 created "2020-01-23" @default.
• W3000220613 creator A5013412452 @default.
• W3000220613 date "2020-01-01" @default.
• W3000220613 modified "2023-09-25" @default.
• W3000220613 title "Inaccuracies in atom probe measurements of semiconductor composition" @default.
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• W3000220613 doi "https://doi.org/10.1016/bs.aiep.2019.11.004" @default.
• W3000220613 hasPublicationYear "2020" @default.
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