Matches in SemOpenAlex for { <https://semopenalex.org/work/W3000254416> ?p ?o ?g. }
- W3000254416 endingPage "278" @default.
- W3000254416 startingPage "266" @default.
- W3000254416 abstract "Abstract The effects of electron irradiation on the performance of GaAs solar cells with a range of architectures is studied. Solar cells with shallow and deep junction designs processed on the native wafer as well as into a thin‐film were irradiated by 1‐MeV electrons with fluence up to 1×10 15 e − /cm 2 . The degradation of the cell performance due to irradiation was studied experimentally and theoretically using model simulations, and a coherent set of minority carriers' lifetime damage constants was derived. The solar cell performance degradation primarily depends on the junction depth and the thickness of the active layers, whereas the material damage shows to be insensitive to the cell architecture and fabrication steps. The modeling study has pointed out that besides the reduction of carriers lifetime, the electron irradiation strongly affects the quality of hetero‐interfaces, an effect scarcely addressed in the literature. It is demonstrated that linear increase with the electron fluence of the surface recombination velocity at the front and rear hetero‐interfaces of the solar cell accurately describes the degradation of the spectral response and of the dark current characteristic upon irradiation. A shallow junction solar cell processed into a thin‐film device has the lowest sensitivity to electron radiation, showing an efficiency at the end of life equivalent to 82% of the beginning‐of‐life efficiency." @default.
- W3000254416 created "2020-01-23" @default.
- W3000254416 creator A5002670393 @default.
- W3000254416 creator A5030612896 @default.
- W3000254416 creator A5052603536 @default.
- W3000254416 creator A5071785633 @default.
- W3000254416 creator A5079086006 @default.
- W3000254416 creator A5080278934 @default.
- W3000254416 creator A5064050395 @default.
- W3000254416 date "2020-01-08" @default.
- W3000254416 modified "2023-10-06" @default.
- W3000254416 title "Electron radiation–induced degradation of GaAs solar cells with different architectures" @default.
- W3000254416 cites W1853936644 @default.
- W3000254416 cites W1864030159 @default.
- W3000254416 cites W1965142513 @default.
- W3000254416 cites W1967411188 @default.
- W3000254416 cites W1975988200 @default.
- W3000254416 cites W1992161255 @default.
- W3000254416 cites W2002815358 @default.
- W3000254416 cites W2004020227 @default.
- W3000254416 cites W2013943268 @default.
- W3000254416 cites W2027426921 @default.
- W3000254416 cites W2029088105 @default.
- W3000254416 cites W2036566418 @default.
- W3000254416 cites W2042750269 @default.
- W3000254416 cites W2046401584 @default.
- W3000254416 cites W2061164569 @default.
- W3000254416 cites W2065704278 @default.
- W3000254416 cites W2068108746 @default.
- W3000254416 cites W2080442359 @default.
- W3000254416 cites W2083903363 @default.
- W3000254416 cites W2084465580 @default.
- W3000254416 cites W2086444178 @default.
- W3000254416 cites W2089658626 @default.
- W3000254416 cites W2113020500 @default.
- W3000254416 cites W2122820597 @default.
- W3000254416 cites W2129465168 @default.
- W3000254416 cites W2133376535 @default.
- W3000254416 cites W2138630646 @default.
- W3000254416 cites W2157140145 @default.
- W3000254416 cites W2164259746 @default.
- W3000254416 cites W2165151817 @default.
- W3000254416 cites W2170351041 @default.
- W3000254416 cites W2195076112 @default.
- W3000254416 cites W2197578937 @default.
- W3000254416 cites W2214766410 @default.
- W3000254416 cites W2294193357 @default.
- W3000254416 cites W2464769906 @default.
- W3000254416 cites W2481823330 @default.
- W3000254416 cites W2491528461 @default.
- W3000254416 cites W2566039616 @default.
- W3000254416 cites W2581826764 @default.
- W3000254416 cites W2617983367 @default.
- W3000254416 cites W2773857860 @default.
- W3000254416 cites W2782185775 @default.
- W3000254416 cites W2794372773 @default.
- W3000254416 cites W2803718254 @default.
- W3000254416 cites W2913498518 @default.
- W3000254416 cites W3213618250 @default.
- W3000254416 cites W904478663 @default.
- W3000254416 doi "https://doi.org/10.1002/pip.3224" @default.
- W3000254416 hasPublicationYear "2020" @default.
- W3000254416 type Work @default.
- W3000254416 sameAs 3000254416 @default.
- W3000254416 citedByCount "18" @default.
- W3000254416 countsByYear W30002544162020 @default.
- W3000254416 countsByYear W30002544162021 @default.
- W3000254416 countsByYear W30002544162022 @default.
- W3000254416 countsByYear W30002544162023 @default.
- W3000254416 crossrefType "journal-article" @default.
- W3000254416 hasAuthorship W3000254416A5002670393 @default.
- W3000254416 hasAuthorship W3000254416A5030612896 @default.
- W3000254416 hasAuthorship W3000254416A5052603536 @default.
- W3000254416 hasAuthorship W3000254416A5064050395 @default.
- W3000254416 hasAuthorship W3000254416A5071785633 @default.
- W3000254416 hasAuthorship W3000254416A5079086006 @default.
- W3000254416 hasAuthorship W3000254416A5080278934 @default.
- W3000254416 hasBestOaLocation W30002544161 @default.
- W3000254416 hasConcept C105163801 @default.
- W3000254416 hasConcept C111337013 @default.
- W3000254416 hasConcept C120665830 @default.
- W3000254416 hasConcept C121332964 @default.
- W3000254416 hasConcept C127413603 @default.
- W3000254416 hasConcept C147120987 @default.
- W3000254416 hasConcept C153385146 @default.
- W3000254416 hasConcept C160671074 @default.
- W3000254416 hasConcept C171250308 @default.
- W3000254416 hasConcept C185544564 @default.
- W3000254416 hasConcept C19067145 @default.
- W3000254416 hasConcept C192562407 @default.
- W3000254416 hasConcept C198865614 @default.
- W3000254416 hasConcept C22078206 @default.
- W3000254416 hasConcept C24326235 @default.
- W3000254416 hasConcept C2779679103 @default.
- W3000254416 hasConcept C2780824857 @default.
- W3000254416 hasConcept C49040817 @default.
- W3000254416 hasConcept C544956773 @default.
- W3000254416 hasConcept C62520636 @default.