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- W3000275433 abstract "Electronic devices make enormous demands on compositional, structural and electrical characterization techniques. These demands have catalysed great technique improvements but, despite this, a large and increasing gap exists between demand and supply, especially in the characterization needs of silicon integrated circuits. These needs are outlined, the shortfall in present 1D, 2D and 3D analytical capabilities is quantitatively assessed and a strategy to bridge this gap by combining the best modelling and characterization methods is presented." @default.
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- W3000275433 title "Where Analytical Techniques Fall Short: A User's Perspective" @default.
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