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- W3004016567 abstract "The extreme value theory was adopted to analyze the temperature dependence of the worst case data retention voltage (DRV) in static random access memory (SRAM). It was found that the measured worst case DRV of bulk and fully depleted (FD) silicon-on-thin-buried-oxide (SOTB) SRAM follow a Gumbel distribution. By extrapolating the fitted Gumbel distribution, the worst DRV of large capacity SRAM at high temperature was estimated. It was also found that the temperature dependence of the worst case DRV in bulk SRAM diminishes as the capacity increases while that in SOTB SRAM is almost unchanged." @default.
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- W3004016567 date "2020-02-28" @default.
- W3004016567 modified "2023-10-02" @default.
- W3004016567 title "Statistical analysis of temperature dependence of worst case static random access memory data retention voltage using extreme value theory" @default.
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- W3004016567 doi "https://doi.org/10.35848/1347-4065/ab70a2" @default.
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