Matches in SemOpenAlex for { <https://semopenalex.org/work/W3024012246> ?p ?o ?g. }
Showing items 1 to 79 of
79
with 100 items per page.
- W3024012246 abstract "The main aim of the research presented in this dissertation is to develop a novel imaging mass spectrometry technique that uses molecular desorption induced by heavy ions accelerated to kinetic energies in the MeV/u regime. Upon impact with a sample, heavy ions accelerated above the Bohr velocity deposit their energy predominantly through electronic stopping and this has been shown to produce high sputtering yields from an insulating sample’s surface. This interaction has been traditionally called electronic sputtering and was first put to analytical use many decades ago by a technique called Plasma Desorption Mass Spectrometry (PDMS). Despite its inability to provide spatially resolved measurements, PDMS became a popular way to analyse biomolecular samples until other techniques, such as matrix-assisted laser desorption/ionisation (MALDI), became readily available. There are many ion beam analysis (IBA) facilities currently operating throughout the world dedicated to accelerating and focusing ion beams with the required kinetic energy to induce electronic sputtering, but until this work there has not been any attempt to develop a time-of-flight secondary ion mass spectrometry (ToF-SIMS) technique that makes use of a scanning proton microprobe facility. This research, therefore, has been performed at the Surrey Ion Beam Centre to explore the benefits of exploiting electronic sputtering in imaging mass spectrometry studies using existing IBA technology and techniques. Due to its initial success, this novel imaging mass spectrometry technique has recently been recognised as by the international scientific community. As will be presented in the final chapter, because MeV primary ions can be focused through thin exit windows to analyse a sample without the need for a vacuum chamber, MeV-SIMS has recently been developed into a fully ambient pressure technique." @default.
- W3024012246 created "2020-05-21" @default.
- W3024012246 creator A5079528064 @default.
- W3024012246 date "2012-01-01" @default.
- W3024012246 modified "2023-09-27" @default.
- W3024012246 title "The Development of MeV Secondary Ion Mass Spectrometry." @default.
- W3024012246 hasPublicationYear "2012" @default.
- W3024012246 type Work @default.
- W3024012246 sameAs 3024012246 @default.
- W3024012246 citedByCount "0" @default.
- W3024012246 crossrefType "dissertation" @default.
- W3024012246 hasAuthorship W3024012246A5079528064 @default.
- W3024012246 hasConcept C113196181 @default.
- W3024012246 hasConcept C121332964 @default.
- W3024012246 hasConcept C125206250 @default.
- W3024012246 hasConcept C145148216 @default.
- W3024012246 hasConcept C150394285 @default.
- W3024012246 hasConcept C162356407 @default.
- W3024012246 hasConcept C162711632 @default.
- W3024012246 hasConcept C171250308 @default.
- W3024012246 hasConcept C178790620 @default.
- W3024012246 hasConcept C184779094 @default.
- W3024012246 hasConcept C185592680 @default.
- W3024012246 hasConcept C187529661 @default.
- W3024012246 hasConcept C19067145 @default.
- W3024012246 hasConcept C192562407 @default.
- W3024012246 hasConcept C198291218 @default.
- W3024012246 hasConcept C199289684 @default.
- W3024012246 hasConcept C22423302 @default.
- W3024012246 hasConcept C43617362 @default.
- W3024012246 hasConcept C50774322 @default.
- W3024012246 hasConcept C77671233 @default.
- W3024012246 hasConceptScore W3024012246C113196181 @default.
- W3024012246 hasConceptScore W3024012246C121332964 @default.
- W3024012246 hasConceptScore W3024012246C125206250 @default.
- W3024012246 hasConceptScore W3024012246C145148216 @default.
- W3024012246 hasConceptScore W3024012246C150394285 @default.
- W3024012246 hasConceptScore W3024012246C162356407 @default.
- W3024012246 hasConceptScore W3024012246C162711632 @default.
- W3024012246 hasConceptScore W3024012246C171250308 @default.
- W3024012246 hasConceptScore W3024012246C178790620 @default.
- W3024012246 hasConceptScore W3024012246C184779094 @default.
- W3024012246 hasConceptScore W3024012246C185592680 @default.
- W3024012246 hasConceptScore W3024012246C187529661 @default.
- W3024012246 hasConceptScore W3024012246C19067145 @default.
- W3024012246 hasConceptScore W3024012246C192562407 @default.
- W3024012246 hasConceptScore W3024012246C198291218 @default.
- W3024012246 hasConceptScore W3024012246C199289684 @default.
- W3024012246 hasConceptScore W3024012246C22423302 @default.
- W3024012246 hasConceptScore W3024012246C43617362 @default.
- W3024012246 hasConceptScore W3024012246C50774322 @default.
- W3024012246 hasConceptScore W3024012246C77671233 @default.
- W3024012246 hasLocation W30240122461 @default.
- W3024012246 hasOpenAccess W3024012246 @default.
- W3024012246 hasPrimaryLocation W30240122461 @default.
- W3024012246 hasRelatedWork W1586230423 @default.
- W3024012246 hasRelatedWork W1761084581 @default.
- W3024012246 hasRelatedWork W1967677652 @default.
- W3024012246 hasRelatedWork W2011340937 @default.
- W3024012246 hasRelatedWork W2014146573 @default.
- W3024012246 hasRelatedWork W2018288772 @default.
- W3024012246 hasRelatedWork W2050679011 @default.
- W3024012246 hasRelatedWork W2068518222 @default.
- W3024012246 hasRelatedWork W2072904341 @default.
- W3024012246 hasRelatedWork W2074162285 @default.
- W3024012246 hasRelatedWork W2075769922 @default.
- W3024012246 hasRelatedWork W2087169901 @default.
- W3024012246 hasRelatedWork W2120330817 @default.
- W3024012246 hasRelatedWork W2150392377 @default.
- W3024012246 hasRelatedWork W26277634 @default.
- W3024012246 hasRelatedWork W2933581860 @default.
- W3024012246 hasRelatedWork W2946226597 @default.
- W3024012246 hasRelatedWork W51294248 @default.
- W3024012246 hasRelatedWork W607841105 @default.
- W3024012246 hasRelatedWork W841107024 @default.
- W3024012246 isParatext "false" @default.
- W3024012246 isRetracted "false" @default.
- W3024012246 magId "3024012246" @default.
- W3024012246 workType "dissertation" @default.