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- W3026427028 endingPage "104020" @default.
- W3026427028 startingPage "104020" @default.
- W3026427028 abstract "Flexoelectricity refers to phenomena that polarization is coupled with strain gradient and stress is coupled with electric gradient. It occurs in all dielectrics, and becomes significant under a sharp conductive tip in piezoresponse force microscopy (PFM), under which large gradients in electromechanical field naturally arise. Here we analyze direct and converse flexoelectric effects under such a scanning probe, using mixed finite element method (FEM) developed under the phenomenological continuum framework. The FEM was first validated by analytic solutions for simple axially-symmetric tubes, and then applied to analyze two different modes of PFM experiments. It reveals that the flexoelectric effect accounts for less than 20% of the measured piezoresponse in a typical piezoelectric material, while mechanical switching via flexoelectricity is only possible for ferroelectric materials having upward polarization, with the switching zone confined to a small region near surface. These analyses explain a number of experimental observations well, and shed insight into complex electromechanical phenomenon under a sharp PFM tip. The theoretical and computational framework developed can also be applied to study flexoelectric effect in other structural configurations." @default.
- W3026427028 created "2020-05-29" @default.
- W3026427028 creator A5008307849 @default.
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- W3026427028 creator A5030716039 @default.
- W3026427028 creator A5033316477 @default.
- W3026427028 creator A5061932133 @default.
- W3026427028 date "2020-09-01" @default.
- W3026427028 modified "2023-10-16" @default.
- W3026427028 title "Electromechanical analysis of direct and converse flexoelectric effects under a scanning probe tip" @default.
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- W3026427028 doi "https://doi.org/10.1016/j.jmps.2020.104020" @default.
- W3026427028 hasPublicationYear "2020" @default.
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