Matches in SemOpenAlex for { <https://semopenalex.org/work/W3031655183> ?p ?o ?g. }
- W3031655183 endingPage "527" @default.
- W3031655183 startingPage "485" @default.
- W3031655183 abstract "This chapter presents results on in situ deformation experiments performed either inside the scanning electron microscope or in combination with other complementary in situ characterization techniques such as digital image correlation, acoustic emission or infrared thermography. The range of materials investigated extends from austenitic CrMnNi steels enabling TRIP (TRansformation Induced Plasticity) and/or TWIP (TWinning Induced Plasticity) effect and austenitic-martensitic-carbidic CrMnNi steels after quenching and partitioning to MgO-partially stabilized zirconia and TRIP matrix composites. The performed mechanical tests include both tensile and compressive loading as well as cyclic loading in a temperature range from room temperature up to 200 °C. The great potential of the applied in situ characterization techniques is their complementarity, which is shown, in particular, by the seven case studies presented. The combination of different techniques—such as the in situ deformation within the SEM combined with the digital image correlation—has a high potential to gain a deeper understanding on strain localizations by different microstructural features such as deformation bands, twin bundles or martensitic nuclei. In addition, these complementary in situ techniques can contribute to the modelling of the deformation behavior of TRIP/TWIP steels, in particular, or for any other kind of materials with complex deformation processes. Here, the acoustic emission measurements offer, in particular, a great potential, since this is the only real time in situ characterization technique delivering bulk information with a time-resolution in the range of microseconds." @default.
- W3031655183 created "2020-06-05" @default.
- W3031655183 creator A5003724014 @default.
- W3031655183 creator A5005052613 @default.
- W3031655183 creator A5065204414 @default.
- W3031655183 date "2020-01-01" @default.
- W3031655183 modified "2023-09-26" @default.
- W3031655183 title "Scanning Electron Microscopy and Complementary In Situ Characterization Techniques for Characterization of Deformation and Damage Processes" @default.
- W3031655183 cites W1053956967 @default.
- W3031655183 cites W1495445162 @default.
- W3031655183 cites W1513919678 @default.
- W3031655183 cites W179372779 @default.
- W3031655183 cites W1875971241 @default.
- W3031655183 cites W1906934393 @default.
- W3031655183 cites W1937116428 @default.
- W3031655183 cites W1966447592 @default.
- W3031655183 cites W1968632552 @default.
- W3031655183 cites W1969252929 @default.
- W3031655183 cites W1972711650 @default.
- W3031655183 cites W1975540188 @default.
- W3031655183 cites W1980020391 @default.
- W3031655183 cites W1980481435 @default.
- W3031655183 cites W1982815888 @default.
- W3031655183 cites W1984196602 @default.
- W3031655183 cites W1987294197 @default.
- W3031655183 cites W1990038269 @default.
- W3031655183 cites W1991284100 @default.
- W3031655183 cites W1993731949 @default.
- W3031655183 cites W1996123054 @default.
- W3031655183 cites W1996549880 @default.
- W3031655183 cites W2000645766 @default.
- W3031655183 cites W2002018672 @default.
- W3031655183 cites W2004297801 @default.
- W3031655183 cites W2014196836 @default.
- W3031655183 cites W2024064247 @default.
- W3031655183 cites W2024156607 @default.
- W3031655183 cites W2025225765 @default.
- W3031655183 cites W2029313846 @default.
- W3031655183 cites W2030943088 @default.
- W3031655183 cites W2031762947 @default.
- W3031655183 cites W2032386854 @default.
- W3031655183 cites W2033463142 @default.
- W3031655183 cites W2035030834 @default.
- W3031655183 cites W2036309335 @default.
- W3031655183 cites W2036311246 @default.
- W3031655183 cites W2041596193 @default.
- W3031655183 cites W2041915511 @default.
- W3031655183 cites W2043510118 @default.
- W3031655183 cites W2043991183 @default.
- W3031655183 cites W2044391411 @default.
- W3031655183 cites W2045223001 @default.
- W3031655183 cites W2046956790 @default.
- W3031655183 cites W2048280193 @default.
- W3031655183 cites W2051332221 @default.
- W3031655183 cites W2054108137 @default.
- W3031655183 cites W2054175336 @default.
- W3031655183 cites W2058335038 @default.
- W3031655183 cites W2060669688 @default.
- W3031655183 cites W2060792947 @default.
- W3031655183 cites W2062413574 @default.
- W3031655183 cites W2071796502 @default.
- W3031655183 cites W2072243722 @default.
- W3031655183 cites W2072279801 @default.
- W3031655183 cites W2074095137 @default.
- W3031655183 cites W2075513024 @default.
- W3031655183 cites W2077604029 @default.
- W3031655183 cites W2078059685 @default.
- W3031655183 cites W2078947134 @default.
- W3031655183 cites W2079192520 @default.
- W3031655183 cites W2086933933 @default.
- W3031655183 cites W2087419598 @default.
- W3031655183 cites W2088886701 @default.
- W3031655183 cites W2094264958 @default.
- W3031655183 cites W2094307587 @default.
- W3031655183 cites W2106587825 @default.
- W3031655183 cites W2118184313 @default.
- W3031655183 cites W2147567168 @default.
- W3031655183 cites W2157469394 @default.
- W3031655183 cites W2161844751 @default.
- W3031655183 cites W2165787505 @default.
- W3031655183 cites W2172108349 @default.
- W3031655183 cites W2191925406 @default.
- W3031655183 cites W2208669389 @default.
- W3031655183 cites W2235611918 @default.
- W3031655183 cites W2264638546 @default.
- W3031655183 cites W2412830039 @default.
- W3031655183 cites W2538020079 @default.
- W3031655183 cites W2617204353 @default.
- W3031655183 cites W2620215219 @default.
- W3031655183 cites W2762710695 @default.
- W3031655183 cites W2801240537 @default.
- W3031655183 cites W2883018182 @default.
- W3031655183 cites W2890516238 @default.
- W3031655183 cites W2921691444 @default.
- W3031655183 cites W2979727196 @default.
- W3031655183 cites W354543021 @default.
- W3031655183 cites W4206035457 @default.
- W3031655183 cites W4210921894 @default.