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- W3035821453 endingPage "379" @default.
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- W3035821453 abstract "Transmission electron microscopy (TEM) is a powerful technique for characterising lattice defects. Image contrast arises from local changes in scattering either due to displacements of atoms or change of type of atom, vacancies, interstitials, etc. The intensities of the diffracted beams are changed in a manner characteristic of the type of defect, and there is a corresponding characteristic image in the TEM. Basically two types of technique based on diffraction are available:- 1) Those in which defect images are produced without resolving the crystal lattice or structure. 2) Those in which the crystal structure is resolved. The first of these has so far had more general application, and the interpretation of the contrast effects of most variant of this technique is based on the many-beam dynamical theory of electron diffraction foi imperfect crystals developed by Howie and Whelan (1961)." @default.
- W3035821453 created "2020-06-25" @default.
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- W3035821453 date "1978-08-01" @default.
- W3035821453 modified "2023-10-18" @default.
- W3035821453 title "Characterisation of Lattice Defects" @default.
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- W3035821453 doi "https://doi.org/10.1017/s0424820100070126" @default.
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