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- W3035924077 abstract "Image intensifiers are widely used on the electron microscopes, mostly for observation and recording of weak images. Usually, the image intensifier is not used in diffraction mode, for the strong direct beam may damage the YAG crystal. However, neither the microscope nor the image intensifier is equipped with any protection mechanism, leaving the safety of the intensifier as the responsibility of the operator. While modifying a JEOL JEM-100C microscope for UHV-REM, we designed a security circuit to blank the electron beam in order not to damage the image intensifier accidentally. The required logic, shown in Fig. 1, indicates the electron beam blanked (1) or unblanked (0) under all possible combinations of three parameters. The requirement is that the beam must be blanked (1) while the view screen is fully raised (1), film not advanced (0), and the SAD button is depressed (1). Blanking is accomplished with a 5V signal applied to a relay and short the deflection coil. The circuit is shown in Fig. 2." @default.
- W3035924077 created "2020-06-25" @default.
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- W3035924077 date "1995-08-13" @default.
- W3035924077 modified "2023-09-23" @default.
- W3035924077 title "A security circuit for the image intensifier on the Electron Microscope" @default.
- W3035924077 doi "https://doi.org/10.1017/s0424820100139676" @default.
- W3035924077 hasPublicationYear "1995" @default.
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