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- W3036003562 abstract "Transmission electron microscopy (TEM) has been used to study the microstructures, especially the ferroelectric domains and boundaries, of ferroelectric crystals and free-standing thin films because they are closely related to the ferroelectric properties of thin films. But, for a long time observations have been made on the assumption that the properties of ferroelectric domains and domain boundaries are the same as those of the bulk crystal, even though sometimes some evidence may have been shown that ferroelectric domains in thin films could be different from those in the bulk material. In fact, weak ferroelectricity of thin films has been noticed. It was found that the ferroelectric characteristics of thin BaTiO 3 ferroelectric films deposited on substrates are different from those of bulk materials. Although in their analysis interfaces and grain boundaries are involved, the mechanism of weak ferroelectricity of thin films and the microstructures which are related to the ferroelectricity of the film remains unclear." @default.
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- W3036003562 date "1994-01-01" @default.
- W3036003562 modified "2023-09-27" @default.
- W3036003562 title "Thickness dependence of ferroelectric domains in thin ferroelectric crystals" @default.
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- W3036003562 doi "https://doi.org/10.1017/s0424820100170542" @default.
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