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- W3036100764 abstract "Quantitative electron microscopy generally implies the measurement of elemental content and/or structures in a given specimen or the 3D reconstruction of a structure. When a feature in a specimenis being quantified in a transmission electron microscope (TEM), the specimen thickness has to bedetermined for at least two reasons. Firstly, thickness is a required parameter in the calculation, for example, of volume and secondly, it is required for the calibration of instrumental conditions ortheoretical parameters such that correction for thickness effects due to conditions such as radiation damage, x-ray absorption or multiple scattering of electrons can be performed. However, it is a common knowledge that specimen thickness is difficult to be determined accurately. The difficulty is mainly due to the nature of TEM specimens. There is no universal method which can be used.Therefore, in order to select a few appropriate methods, it is necessary that a wide range of methods be reviewed and critically assessed. Numerous methods are available for the measurement of the thickness of a specimen to be analysed in a TEM (Table 1)." @default.
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- W3036100764 date "1993-08-01" @default.
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- W3036100764 title "Thickness measurement in quantitative Electron Microscopy" @default.
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- W3036100764 doi "https://doi.org/10.1017/s0424820100148241" @default.
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