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- W3036184401 abstract "Thin film growth in Frank-van der Merwe mode is accompanied by formation of misfit dislocation (MD) grid onto the interface of the film and a substrate.MD'e are playing important role in definition of such characteristics of epitaxial bycrastals,as the elastic strain values of the film and the substrate,the densitu of surface states for charge carriers,stability of manylayer systems,ets. It was shown on the examples of β-Co/Cu,Cu/β-Co,Pt/Au and Al/Ag epitaxial bycrystals that at small misfits ( f<∼2%) MD's are introduced unhomogeneously onto interface (Fig.1,a) and features of MD's (distribution, density, Burgers vector) can be studied only by analysis of electron microscopy images.The periodicity of MD's is improving with increasing of f ⋝ 3% (Fig.1,b) due to introduction of them from the surface of film by climb and features of MD's can be studied by electron diffraction due to periodic array of MD's [3] .It was shown on the examples of PbS/PbTe,PbTe/PbSe,PbS/PbSe,Bi/Sb and Sb/Bi epitaxial bycrystals [4],that from diffractin pattern (Fig.1,c) one can easily deduce such features of MD's,as symmetry of their grid,mean interdislocation distance,their orientation relatively lattices of film and substrate and projection of edge component of their Burger's vector onto interface." @default.
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- W3036184401 date "1978-01-01" @default.
- W3036184401 modified "2023-09-26" @default.
- W3036184401 title "New possibilities of electron microscopy for misfit dislocation studies!" @default.
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- W3036184401 doi "https://doi.org/10.1017/s0424820100108738" @default.
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