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- W3036404267 abstract "A common requirement for both Atom Probe Field-Ion Microscopy (APFIM) and Scanning Tunnelling Microscopy (STM) is a sharp pointed tip for use as either the specimen (APFIM) or the probe (STM). Traditionally, tips have been prepared by either chemical or electropolishing techniques. Recently, ion-milling has been successfully employed in the production of APFIM tips [1]. Conventional electropolishing techniques are applicable to a wide variety of metals, but generally require careful manual adjustments during the polishing process and may also be time-consuming. In order to reduce the time and effort involved in the preparation process, a compact, self-contained polishing unit has been developed. This system is based upon the conventional two-stage electropolishing technique in which the specimen/tip blank is first locally thinned or “necked”, and subsequently electropolished until separation occurs.[2,3] The result of this process is the production of two APFIM or STM tips. A mechanized polishing unit that provides these functions while automatically maintaining alignment has been designed and developed." @default.
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- W3036404267 date "1990-08-12" @default.
- W3036404267 modified "2023-09-25" @default.
- W3036404267 title "An Improved Method for the Preparation and TEM Examination of Sharp Pointed Tips used in APFIM and STM" @default.
- W3036404267 cites W2121296369 @default.
- W3036404267 doi "https://doi.org/10.1017/s0424820100134107" @default.
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