Matches in SemOpenAlex for { <https://semopenalex.org/work/W3036553210> ?p ?o ?g. }
- W3036553210 endingPage "33898" @default.
- W3036553210 startingPage "33887" @default.
- W3036553210 abstract "Low-temperature (≤400 °C), stackable oxide semiconductors are promising as an upper transistor ingredient for monolithic three-dimensional integration. The atomic layer deposition (ALD) route provides a low-defect, high-quality semiconducting oxide channel layer and enables accurate controllability of the chemical composition and physical thickness as well as excellent step coverage on nanoscale trench structures. Here, we report a high-mobility heterojunction transistor in a ternary indium gallium zinc oxide system using the ALD technique. The heterojunction channel structure consists of a 10 nm thick indium gallium oxide (IGO) layer as an effective transporting layer and a 3 nm thick, wide band gap ZnO layer. The formation of a two-dimensional electron gas was suggested by controlling the band gap of the IGO quantum well through In/Ga ratio tailoring and reducing the physical thickness of the ZnO film. A field-effect transistor (FET) with a ZnO/In0.83Ga0.17O1.5 heterojunction channel exhibited the highest field-effect mobility of 63.2 ± 0.26 cm2/V s, a low subthreshold gate swing of 0.26 ± 0.03 V/dec, a threshold voltage of -0.84 ± 0.85 V, and an ION/OFF ratio of 9 × 108. This surpasses the performance (carrier mobility of ∼41.7 ± 1.43 cm2/V s) of an FET with a single In0.83Ga0.17O1.5 channel. Furthermore, the gate bias stressing test results indicate that FETs with a ZnO/In1-xGaxO1.5 (x = 0.25 and 0.17) heterojunction channel are much more stable than those with a single In1-xGaxO1.5 (x = 0.35, 0.25, and 0.17) channel. Relevant discussion is given in detail on the basis of chemical characterization and technological computer-aided design simulation." @default.
- W3036553210 created "2020-06-25" @default.
- W3036553210 creator A5005183857 @default.
- W3036553210 creator A5007565727 @default.
- W3036553210 creator A5016298544 @default.
- W3036553210 creator A5037111704 @default.
- W3036553210 creator A5050200921 @default.
- W3036553210 creator A5052324997 @default.
- W3036553210 creator A5071325470 @default.
- W3036553210 date "2020-06-23" @default.
- W3036553210 modified "2023-10-17" @default.
- W3036553210 title "Atomic Layer Deposition Process-Enabled Carrier Mobility Boosting in Field-Effect Transistors through a Nanoscale ZnO/IGO Heterojunction" @default.
- W3036553210 cites W1581456708 @default.
- W3036553210 cites W1965142452 @default.
- W3036553210 cites W1969008407 @default.
- W3036553210 cites W1973813113 @default.
- W3036553210 cites W1982684403 @default.
- W3036553210 cites W1982968328 @default.
- W3036553210 cites W1983861236 @default.
- W3036553210 cites W1988060319 @default.
- W3036553210 cites W1993258941 @default.
- W3036553210 cites W1999589524 @default.
- W3036553210 cites W2001333868 @default.
- W3036553210 cites W2005994249 @default.
- W3036553210 cites W2007737299 @default.
- W3036553210 cites W2010540469 @default.
- W3036553210 cites W2021994802 @default.
- W3036553210 cites W2029413399 @default.
- W3036553210 cites W2033787147 @default.
- W3036553210 cites W2037822222 @default.
- W3036553210 cites W2047050844 @default.
- W3036553210 cites W2048484252 @default.
- W3036553210 cites W2057262322 @default.
- W3036553210 cites W2070839040 @default.
- W3036553210 cites W2076631604 @default.
- W3036553210 cites W2077400700 @default.
- W3036553210 cites W2084891739 @default.
- W3036553210 cites W2087515045 @default.
- W3036553210 cites W2114776920 @default.
- W3036553210 cites W2131716975 @default.
- W3036553210 cites W2156139308 @default.
- W3036553210 cites W2212568496 @default.
- W3036553210 cites W2288643850 @default.
- W3036553210 cites W2332118884 @default.
- W3036553210 cites W2564881023 @default.
- W3036553210 cites W2568863549 @default.
- W3036553210 cites W2595507527 @default.
- W3036553210 cites W2609632465 @default.
- W3036553210 cites W2729746850 @default.
- W3036553210 cites W2751309266 @default.
- W3036553210 cites W2766881809 @default.
- W3036553210 cites W2787436773 @default.
- W3036553210 cites W2793355244 @default.
- W3036553210 cites W2886146119 @default.
- W3036553210 cites W2888778400 @default.
- W3036553210 cites W2891497440 @default.
- W3036553210 cites W2928778839 @default.
- W3036553210 cites W2933664458 @default.
- W3036553210 cites W2942598410 @default.
- W3036553210 cites W2960757674 @default.
- W3036553210 cites W2965993642 @default.
- W3036553210 cites W2978176079 @default.
- W3036553210 cites W2988708515 @default.
- W3036553210 cites W2995599656 @default.
- W3036553210 doi "https://doi.org/10.1021/acsami.0c06382" @default.
- W3036553210 hasPubMedId "https://pubmed.ncbi.nlm.nih.gov/32571011" @default.
- W3036553210 hasPublicationYear "2020" @default.
- W3036553210 type Work @default.
- W3036553210 sameAs 3036553210 @default.
- W3036553210 citedByCount "35" @default.
- W3036553210 countsByYear W30365532102020 @default.
- W3036553210 countsByYear W30365532102021 @default.
- W3036553210 countsByYear W30365532102022 @default.
- W3036553210 countsByYear W30365532102023 @default.
- W3036553210 crossrefType "journal-article" @default.
- W3036553210 hasAuthorship W3036553210A5005183857 @default.
- W3036553210 hasAuthorship W3036553210A5007565727 @default.
- W3036553210 hasAuthorship W3036553210A5016298544 @default.
- W3036553210 hasAuthorship W3036553210A5037111704 @default.
- W3036553210 hasAuthorship W3036553210A5050200921 @default.
- W3036553210 hasAuthorship W3036553210A5052324997 @default.
- W3036553210 hasAuthorship W3036553210A5071325470 @default.
- W3036553210 hasConcept C106782819 @default.
- W3036553210 hasConcept C119599485 @default.
- W3036553210 hasConcept C127413603 @default.
- W3036553210 hasConcept C145598152 @default.
- W3036553210 hasConcept C165801399 @default.
- W3036553210 hasConcept C171250308 @default.
- W3036553210 hasConcept C172385210 @default.
- W3036553210 hasConcept C181966813 @default.
- W3036553210 hasConcept C192562407 @default.
- W3036553210 hasConcept C195370968 @default.
- W3036553210 hasConcept C2779227376 @default.
- W3036553210 hasConcept C49040817 @default.
- W3036553210 hasConcept C69544855 @default.
- W3036553210 hasConcept C79794668 @default.
- W3036553210 hasConceptScore W3036553210C106782819 @default.
- W3036553210 hasConceptScore W3036553210C119599485 @default.