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- W3036883412 abstract "The aim of this paper is to critically review the latest commercial and scientific resist developments in the light of the needs of the semiconductor industry in direct write applications. These needs can be expressed as a set of usable ranges for sensitivity, resolution, and process compatibility, most notably dry etch resistance. The resist sensitivity needed for tolerable throughput varies from 0.5uCoul/cm 2 to 20 uCoul/cm 2 depending on the machine being used. Submicron resolution is now a necessity (0.1-1.0 um) because circuits with 1-2 um features are being made using optical lithography. The resolution limit of a resist is difficult to measure because resolution depends critically on the “image quality” (beam size/shape). Furthermore, for a given critical dimension to be used in a VLSI Si process, that dimension must be reproducible to within tight statistical limits, eg., for Hewlett-Packard's NMOS process the requirement is 1.5um lines, 1um spaces with a 3σ of +/− 0.25um (99.9% confidence limit). With these caveats, SEM's of resolution test paterns can be used as a guide to working resolution." @default.
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- W3036883412 date "1983-08-01" @default.
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- W3036883412 title "Electron beam resist systems: A critical review of recent developments" @default.
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- W3036883412 doi "https://doi.org/10.1017/s042482010007432x" @default.
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