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- W3036898863 abstract "In recent years, there has been increasing demand for higher voltage SEMs, in the field of surface observation, especially that of magnetic domains, dislocations, and electron channeling patterns by backscattered electron microscopy. On the other hand, the resolution of the CTEM has now reached 1 ∼ 2Å, and several reports have recently been made on the observation of atom images, indicating that the ultimate goal of morphological observation has beem nearly achieved." @default.
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- W3036898863 date "1974-08-15" @default.
- W3036898863 modified "2023-09-25" @default.
- W3036898863 title "Development of 200 kV Scanning-Transmission Electron Microscope" @default.
- W3036898863 doi "https://doi.org/10.1017/s0424820100052067" @default.
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