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- W3036939905 abstract "The detectors on modern electron microscopes often have a very high bandwidth which makes their outputs appear noisy on a short time scale. This noise is not a problem when photographing an image because the film integrates the signal. But it causes an annoying blurring of the trace in slow y-modulated line scans and can result in large errors if the signal is measured with a fast analog to digital converter (ADC)(Figs, 1,2). The noise in digital measurements can be reduced by reading the detector may times and taking the numerical average of the readings. This requires no extra hardware but it increases the time required to acquire a linescan or image and ignores the fundamental problem that the ADC wastes most of the information available in the signal by only sampling for a very small portion of its total cycle time." @default.
- W3036939905 created "2020-06-25" @default.
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- W3036939905 date "1987-08-01" @default.
- W3036939905 modified "2023-09-28" @default.
- W3036939905 title "Making optimum use of the signal in image digitization" @default.
- W3036939905 doi "https://doi.org/10.1017/s0424820100125439" @default.
- W3036939905 hasPublicationYear "1987" @default.
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