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- W3037575708 abstract "Chip manufacturers introduce redundancy at various levels of CPU design to guarantee correct operation, even for worst-case combinations of non-idealities in process variation and system operating conditions. This redundancy is implemented partly in the form of voltage margins. However, for a wide range of real-world execution scenarios these margins are excessive and merely translate to increased power consumption, hindering the effort towards higher energy efficiency in both HPC and general purpose computing. Our study on the x86-64 Haswell and Skylake multicore microarchitectures reveals wide voltage margins, which vary across different microarchitectures, different chip parts of the same microarchitecture, and across different workloads. We find that it is necessary to quantify voltage margins using multi-threaded and multi-instance workloads, as characterization with single-threaded and single-instance workloads that do not stress the CPU to its full capacity typically identifies overly optimistic margins that lead to errors when applied in realistic program execution scenarios. In addition, we introduce, deploy and evaluate a run-time governor that dynamically reduces the supply voltage of modern multicore x86-64 CPUs. Our governor employs a model that takes as input a set of performance metrics which are directly measurable via performance monitoring counters and have high predictive value for the minimum tolerable supply voltage ( $V_{min}$ V m i n ), to predict and apply the appropriate reduction for the workload at hand. Compared with the conventional DVFS governor, our approach achieves up to 42 percent energy savings for the Skylake family and 34 percent for the Haswell family for complex, real-world applications." @default.
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- W3037575708 date "2020-12-01" @default.
- W3037575708 modified "2023-09-27" @default.
- W3037575708 title "Dynamic Undervolting to Improve Energy Efficiency on Multicore X86 CPUs" @default.
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- W3037575708 doi "https://doi.org/10.1109/tpds.2020.3004383" @default.
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