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- W3042849748 abstract "In piezoresponse force microscopy and electrochemical strain microscopy (PFM, ESM), not only nanoscale electromechanical surface displacements (e.g., Vegard strain in case of ESM) are amplified in contact resonance; global cantilever capacitive forces are as well. In addition, other nanoscale nonelectrical contact mechanics could contribute to the contrast formation, too. Here we propose a method to separate these contributions by using the band excitation method together with an amplitude modulated high-frequency electric potential applied to the cantilever. Compared to the conventional DC biased low-frequency AC contact resonance mode, this allows us to determine voltage and frequency-dependent nanoscale surface responses quantitatively, because the capacitive components are deducted. Numerical simulations based on the Euler–Bernoulli equation together with experiments on Li-ion conducting glass ceramics (LICGCs) and on the mixed Cu-ion/electron-conducting material Cu2Mo6S8 demonstrate the advantages of this approach." @default.
- W3042849748 created "2020-07-23" @default.
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- W3042849748 date "2020-07-17" @default.
- W3042849748 modified "2023-10-01" @default.
- W3042849748 title "Voltage- and Frequency-Based Separation of Nanoscale Electromechanical and Electrostatic Forces in Contact Resonance Force Microscopy: Implications for the Analysis of Battery Materials" @default.
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- W3042849748 doi "https://doi.org/10.1021/acsanm.0c00989" @default.
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