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- W3043800116 abstract "In the present work, non-stoichiometric silicon oxide films (SiOx) deposited using a hot filament chemical vapor deposition technique at short time and simple parameters of depositions are reported. This is motivated by the numerous potential applications of SiOx films in areas such as optoelectronics. SiOx films were characterized with different spectroscopic techniques. The deposited films have interesting characteristics such as the presence of silicon nanoclusters without applying thermal annealing, in addition to a strong photoluminescence after applying thermal annealing in the vicinity of 1.5 eV, which may be attributed to the presence of small, oxidized silicon grains (less than 2 nm) or silicon nanocrystals (Si-nc). An interesting correlation was found between oxygen content, the presence of hydrogen, and the formation of defects in the material, with parameters such as the band gap and the Urbach energies. This correlation is interesting in the development of band gap engineering for this material for applications in photonic devices." @default.
- W3043800116 created "2020-07-23" @default.
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- W3043800116 date "2020-07-20" @default.
- W3043800116 modified "2023-10-03" @default.
- W3043800116 title "Spectroscopic Properties of Si-nc in SiOx Films Using HFCVD" @default.
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- W3043800116 doi "https://doi.org/10.3390/nano10071415" @default.
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