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- W3044072673 abstract "Abstract Ridge-cracked blisters form when ridge cracking occurs in a biaxially compressed film on a relatively rigid substrate during buckle-delamination. The observation of telephone-cord (TC) blister with wavy ridge crack indicates that the ridge-cracked blister is not straight-sided as it used to be. How ridge cracking influences the profile of buckle-delamination remains unclear. Based on Foppl–von Karman (FvK) nonlinear plate theory, we derive an improved analytical solution for a better description of the cross-sectional profile of the straight-sided blister with straight-sided ridge crack through considering the effect of hinge position caused by the ridge crack. Following a similar procedure in the case of the straight-sided ridge-cracked blister, an approximate solution of FvK plate in curvilinear coordinates is further obtained for the cross-sectional profile of the TC ridge-cracked blister. The results show that the position of the ridge crack significantly modifies the asymmetry, the shape, and the maximum deflection of the cross-sectional profile of the resulting blister." @default.
- W3044072673 created "2020-07-29" @default.
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- W3044072673 date "2020-11-01" @default.
- W3044072673 modified "2023-09-24" @default.
- W3044072673 title "Impact of ridge cracking on the morphology of buckle-delamination" @default.
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- W3044072673 doi "https://doi.org/10.1016/j.ijnonlinmec.2020.103561" @default.
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