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- W3045058755 abstract "We propose a novel strategy of formalized synthesis of Software Based Self-Test (SBST) for testing microprocessors with RISC architecture to cover a large class of high-level functional faults. This is comparable to that used in memory testing which also covers a large class of structural faults such as stuck-at-faults (SAF), conditional SAF, multiple SAF and bridging faults. The approach is fully high-level, the model of the microprocessor is derived from the instruction set and architecture description, and no knowledge about gate-level implementation is needed. To keep the approach scalable, the microprocessor is partitioned into modules under test (MUT), and each MUT is in turn partitioned into data and control parts. For the data parts, pseudo-exhaustive tests are applied, while for the control parts, a novel generic functional control fault model was developed. A novel method for measuring high-level fault coverage for the control parts of MUTs is proposed. The measure can be interpreted as the quality of covering the high-level functional faults, which are difficult to enumerate. We apply High-Level Decision Diagrams for formalization and optimization of high-level test generation for control parts of modules and for trading off different test characteristics, such as test length, test generation time and fault coverage. The test is well-structured and can be easily unrolled online during test execution. Experimental results demonstrate high SAF coverage, achieved for a part of a RISC processor with known implementation, whereas the test was generated without knowledge of implementation details." @default.
- W3045058755 created "2020-07-29" @default.
- W3045058755 creator A5010286547 @default.
- W3045058755 creator A5010536057 @default.
- W3045058755 creator A5059391257 @default.
- W3045058755 creator A5065172476 @default.
- W3045058755 date "2020-01-01" @default.
- W3045058755 modified "2023-09-26" @default.
- W3045058755 title "On Test Generation for Microprocessors for Extended Class of Functional Faults" @default.
- W3045058755 cites W1927443640 @default.
- W3045058755 cites W1965015817 @default.
- W3045058755 cites W1993225874 @default.
- W3045058755 cites W1995827686 @default.
- W3045058755 cites W2008990681 @default.
- W3045058755 cites W2011494794 @default.
- W3045058755 cites W2011745694 @default.
- W3045058755 cites W2031313028 @default.
- W3045058755 cites W2033613342 @default.
- W3045058755 cites W2061104937 @default.
- W3045058755 cites W2071841318 @default.
- W3045058755 cites W2082836981 @default.
- W3045058755 cites W2103363686 @default.
- W3045058755 cites W2105522986 @default.
- W3045058755 cites W2106864957 @default.
- W3045058755 cites W2115386046 @default.
- W3045058755 cites W2115795793 @default.
- W3045058755 cites W2126042558 @default.
- W3045058755 cites W2127346720 @default.
- W3045058755 cites W2130231461 @default.
- W3045058755 cites W2152640154 @default.
- W3045058755 cites W2155341425 @default.
- W3045058755 cites W2156710719 @default.
- W3045058755 cites W2162696040 @default.
- W3045058755 cites W2170296906 @default.
- W3045058755 cites W2334801967 @default.
- W3045058755 cites W2499061244 @default.
- W3045058755 cites W2800011419 @default.
- W3045058755 cites W2991906641 @default.
- W3045058755 cites W4210836009 @default.
- W3045058755 cites W4242469033 @default.
- W3045058755 cites W580566346 @default.
- W3045058755 doi "https://doi.org/10.1007/978-3-030-53273-4_2" @default.
- W3045058755 hasPublicationYear "2020" @default.
- W3045058755 type Work @default.
- W3045058755 sameAs 3045058755 @default.
- W3045058755 citedByCount "0" @default.
- W3045058755 crossrefType "book-chapter" @default.
- W3045058755 hasAuthorship W3045058755A5010286547 @default.
- W3045058755 hasAuthorship W3045058755A5010536057 @default.
- W3045058755 hasAuthorship W3045058755A5059391257 @default.
- W3045058755 hasAuthorship W3045058755A5065172476 @default.
- W3045058755 hasBestOaLocation W30450587553 @default.
- W3045058755 hasConcept C118524514 @default.
- W3045058755 hasConcept C127313418 @default.
- W3045058755 hasConcept C149635348 @default.
- W3045058755 hasConcept C151730666 @default.
- W3045058755 hasConcept C154945302 @default.
- W3045058755 hasConcept C173608175 @default.
- W3045058755 hasConcept C2777212361 @default.
- W3045058755 hasConcept C2777267654 @default.
- W3045058755 hasConcept C41008148 @default.
- W3045058755 hasConceptScore W3045058755C118524514 @default.
- W3045058755 hasConceptScore W3045058755C127313418 @default.
- W3045058755 hasConceptScore W3045058755C149635348 @default.
- W3045058755 hasConceptScore W3045058755C151730666 @default.
- W3045058755 hasConceptScore W3045058755C154945302 @default.
- W3045058755 hasConceptScore W3045058755C173608175 @default.
- W3045058755 hasConceptScore W3045058755C2777212361 @default.
- W3045058755 hasConceptScore W3045058755C2777267654 @default.
- W3045058755 hasConceptScore W3045058755C41008148 @default.
- W3045058755 hasLocation W30450587551 @default.
- W3045058755 hasLocation W30450587552 @default.
- W3045058755 hasLocation W30450587553 @default.
- W3045058755 hasLocation W30450587554 @default.
- W3045058755 hasOpenAccess W3045058755 @default.
- W3045058755 hasPrimaryLocation W30450587551 @default.
- W3045058755 hasRelatedWork W1509211761 @default.
- W3045058755 hasRelatedWork W1558545464 @default.
- W3045058755 hasRelatedWork W1984303163 @default.
- W3045058755 hasRelatedWork W1987204888 @default.
- W3045058755 hasRelatedWork W2117014006 @default.
- W3045058755 hasRelatedWork W2358725432 @default.
- W3045058755 hasRelatedWork W2372170743 @default.
- W3045058755 hasRelatedWork W3047022145 @default.
- W3045058755 hasRelatedWork W4233815414 @default.
- W3045058755 hasRelatedWork W99847340 @default.
- W3045058755 isParatext "false" @default.
- W3045058755 isRetracted "false" @default.
- W3045058755 magId "3045058755" @default.
- W3045058755 workType "book-chapter" @default.