Matches in SemOpenAlex for { <https://semopenalex.org/work/W3048199311> ?p ?o ?g. }
- W3048199311 endingPage "012023" @default.
- W3048199311 startingPage "012023" @default.
- W3048199311 abstract "In this article we describe the scanning electron microscopy (SEM) techniques of electron channelling contrast imaging and electron backscatter diffraction. These techniques provide information on crystal structure, crystal misorientation, grain boundaries, strain and structural defects on length scales from tens of nanometres to tens of micrometres. Here we report on the imaging and analysis of dislocations and sub-grains in nitride semiconductor thin films (GaN and AlN) and tungsten carbide-cobalt (WC-Co) hard metals. Our aim is to illustrate the capability of these techniques for investigating structural defects in the SEM and the benefits of combining these diffraction-based imaging techniques." @default.
- W3048199311 created "2020-08-13" @default.
- W3048199311 creator A5002751067 @default.
- W3048199311 creator A5004304965 @default.
- W3048199311 creator A5004868232 @default.
- W3048199311 creator A5005536267 @default.
- W3048199311 creator A5006714220 @default.
- W3048199311 creator A5010211393 @default.
- W3048199311 creator A5013867946 @default.
- W3048199311 creator A5014202346 @default.
- W3048199311 creator A5014497650 @default.
- W3048199311 creator A5015704633 @default.
- W3048199311 creator A5015884541 @default.
- W3048199311 creator A5018748463 @default.
- W3048199311 creator A5021473664 @default.
- W3048199311 creator A5025052289 @default.
- W3048199311 creator A5025659839 @default.
- W3048199311 creator A5025923344 @default.
- W3048199311 creator A5028961570 @default.
- W3048199311 creator A5031351295 @default.
- W3048199311 creator A5034830011 @default.
- W3048199311 creator A5042025020 @default.
- W3048199311 creator A5046287197 @default.
- W3048199311 creator A5047854321 @default.
- W3048199311 creator A5051818440 @default.
- W3048199311 creator A5052311928 @default.
- W3048199311 creator A5052344672 @default.
- W3048199311 creator A5058618645 @default.
- W3048199311 creator A5060965495 @default.
- W3048199311 creator A5066847868 @default.
- W3048199311 creator A5069940363 @default.
- W3048199311 creator A5070967158 @default.
- W3048199311 creator A5071514972 @default.
- W3048199311 creator A5071903232 @default.
- W3048199311 creator A5072575380 @default.
- W3048199311 creator A5080710577 @default.
- W3048199311 creator A5084831995 @default.
- W3048199311 creator A5091400915 @default.
- W3048199311 creator A5091797621 @default.
- W3048199311 date "2020-08-06" @default.
- W3048199311 modified "2023-09-30" @default.
- W3048199311 title "Advances in electron channelling contrast imaging and electron backscatter diffraction for imaging and analysis of structural defects in the scanning electron microscope" @default.
- W3048199311 cites W1549438340 @default.
- W3048199311 cites W1747123801 @default.
- W3048199311 cites W1919416863 @default.
- W3048199311 cites W1983797223 @default.
- W3048199311 cites W2009761288 @default.
- W3048199311 cites W2014298488 @default.
- W3048199311 cites W2036293114 @default.
- W3048199311 cites W2050544135 @default.
- W3048199311 cites W2051340317 @default.
- W3048199311 cites W2057803525 @default.
- W3048199311 cites W2066071619 @default.
- W3048199311 cites W2068321697 @default.
- W3048199311 cites W2086524472 @default.
- W3048199311 cites W2087501092 @default.
- W3048199311 cites W2089613916 @default.
- W3048199311 cites W2092872386 @default.
- W3048199311 cites W2134512404 @default.
- W3048199311 cites W2153077083 @default.
- W3048199311 cites W2279613911 @default.
- W3048199311 cites W2320063064 @default.
- W3048199311 cites W2326073765 @default.
- W3048199311 cites W2479715393 @default.
- W3048199311 cites W2505396311 @default.
- W3048199311 cites W2511157125 @default.
- W3048199311 cites W2607448535 @default.
- W3048199311 cites W2748115749 @default.
- W3048199311 cites W2752452526 @default.
- W3048199311 cites W2759115356 @default.
- W3048199311 cites W2791026133 @default.
- W3048199311 cites W2803412346 @default.
- W3048199311 cites W2810365340 @default.
- W3048199311 cites W2886813692 @default.
- W3048199311 cites W2899743154 @default.
- W3048199311 cites W2943322759 @default.
- W3048199311 cites W2965077032 @default.
- W3048199311 cites W2976110089 @default.
- W3048199311 cites W2985414951 @default.
- W3048199311 cites W2997462036 @default.
- W3048199311 cites W3003930600 @default.
- W3048199311 cites W3102292015 @default.
- W3048199311 doi "https://doi.org/10.1088/1757-899x/891/1/012023" @default.
- W3048199311 hasPublicationYear "2020" @default.
- W3048199311 type Work @default.
- W3048199311 sameAs 3048199311 @default.
- W3048199311 citedByCount "0" @default.
- W3048199311 crossrefType "journal-article" @default.
- W3048199311 hasAuthorship W3048199311A5002751067 @default.
- W3048199311 hasAuthorship W3048199311A5004304965 @default.
- W3048199311 hasAuthorship W3048199311A5004868232 @default.
- W3048199311 hasAuthorship W3048199311A5005536267 @default.
- W3048199311 hasAuthorship W3048199311A5006714220 @default.
- W3048199311 hasAuthorship W3048199311A5010211393 @default.
- W3048199311 hasAuthorship W3048199311A5013867946 @default.
- W3048199311 hasAuthorship W3048199311A5014202346 @default.
- W3048199311 hasAuthorship W3048199311A5014497650 @default.
- W3048199311 hasAuthorship W3048199311A5015704633 @default.