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- W3048325021 abstract "Industrial x-ray computed tomography (CT) is a very promising method for non-destructive analysis and inspection of complex parts. CT technique allows to measure internal geometries, which are inaccessible by conventional measurement systems like laser scanner or CMM. Most industrial CT scanners technologies can be split in two categories, each using a fan or cone beam of X-rays. With cone beam CT is possible to decrease the scanning time compared to fan beam CT but scattered radiation can affect the image quality. The aim of this paper is to present the advantages of GE’s scatter correct to obtain high quality images of complex parts with reduced scanning time. The analysis of the reconstructed volume allows dimensional quality control of components with internal cavities, in particular for the measurement of novel additive manufactured (AM) parts, because of the inherent ability of AM to produce parts with complex internal geometries. Other fields of application for CT scan are reverse engineering and failure analysis." @default.
- W3048325021 created "2020-08-13" @default.
- W3048325021 creator A5033165631 @default.
- W3048325021 date "2020-06-01" @default.
- W3048325021 modified "2023-09-24" @default.
- W3048325021 title "The Scatter Correct Technology on GE Phoenix V|Tome|x CT System" @default.
- W3048325021 cites W2034141121 @default.
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- W3048325021 doi "https://doi.org/10.1109/metroaerospace48742.2020.9160159" @default.
- W3048325021 hasPublicationYear "2020" @default.
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