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- W3065149780 abstract "The dielectric and physical properties of nanoscale thin films are significantly enhanced by atomic layer substrate biasing." @default.
- W3065149780 created "2020-08-24" @default.
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- W3065149780 date "2020-01-01" @default.
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- W3065149780 title "Dielectric properties and reliability enhancement of atomic layer deposited thin films by <i>in situ</i> atomic layer substrate biasing" @default.
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