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• W3088332372 startingPage "147886" @default.
• W3088332372 abstract "Semiconductor thin films grown on weakly interacting substrates have recently attracted much attention due to the fact that one can peel/release the film from its substrate for flexible electronic and optoelectronic applications. In this work we report separable CdTe(1 1 1) epitaxial films grown on mica substrate via vapor transport deposition. The CdTe films were separated from the mica substrate using double-sided Cu tape, exposing the CdTe interface-surface. Azimuthal reflection high-energy electron diffraction (ARHEED) was used to characterize the fresh CdTe interface-surface and the original CdTe surface. Dramatic differences between these two surfaces were observed. (1) Diffraction streaks were observed from the interface-surface, indicating a smooth surface. Diffraction spots were observed from the surface, indicating a rough surface. (2) The rough CdTe surface has twin and secondary twin structures, which are difficult to be observed with conventional X-ray diffraction. (3) The full-width-at-half maximum (FWHM) analysis of the streaks and spots in RHEED patterns reveals that despite the smoothness of the interface-surface, there is a lower degree of lateral long-range order as compared with the rough surface. This etchant-free method to create smooth interface-surface and ARHEED characterization may be applicable to other films that are detachable from weakly interacting substrates." @default.
• W3088332372 created "2020-10-01" @default.
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• W3088332372 date "2021-01-01" @default.
• W3088332372 modified "2023-10-18" @default.
• W3088332372 title "Water-assisted exfoliation of epitaxial CdTe film from mica analyzed with azimuthal RHEED" @default.
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• W3088332372 doi "https://doi.org/10.1016/j.apsusc.2020.147886" @default.
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