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- W3091774265 abstract "A method is proposed which detects resistive-open defects of power TSVs in power distribution networks by measuring resistance between power micro-bumps. Utilizing the monotonically increasing property of the measured resistance when the resistance of TSV under test increases, the method defines the minimum defective resistance R min of TSVs and uses it as the resistance of defective TSV in statistical fault simulations. Simulation results of a 3D-IC example with two dies show that the proposed method can detect resistive-open defects although defect coverage is decreased when R min is decreased." @default.
- W3091774265 created "2020-10-15" @default.
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- W3091774265 date "2020-05-17" @default.
- W3091774265 modified "2023-09-25" @default.
- W3091774265 title "Detecting Resistive-Open Defects of TSVs in Power Distribution Network of 3D-IC" @default.
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- W3091774265 doi "https://doi.org/10.1109/spi48784.2020.9218143" @default.
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