Matches in SemOpenAlex for { <https://semopenalex.org/work/W3094497118> ?p ?o ?g. }
- W3094497118 abstract "Fluctuating parametric shifts that arise from the stochastic capture/emission by oxide traps in small gate-area MOSFETs have triggered considerable interest due to their impact on timing-sensitive circuits. To date, studies have only reported the effect of gate voltage stress on oxide traps, while the effect of drain voltage stress is equally important but is seldom studied. This work examines the impact of channel hot-hole (CHH) stress on oxide traps in a nanoscale p-MOSFET. A change in the traps’ emission time constants under operating gate voltage is observed after the CHH stress. Traps which are relatively inactive (capture once and does not emit within the measurement timeframe) may be rendered much more active (exhibit many capture and emission events) after the CHH stress due to a decrease in the emission time constant. On the other hand, traps which are active may become inactive after the CHH stress due to an increase of the emission time constant. Reversion to the pre-CHH-stress behavior is observed after extended rest under unbiased condition. The traps could then undergo similar changes in emission behavior when the CHH stress is reapplied." @default.
- W3094497118 created "2020-10-29" @default.
- W3094497118 creator A5003039060 @default.
- W3094497118 creator A5068456167 @default.
- W3094497118 creator A5088326953 @default.
- W3094497118 date "2020-11-01" @default.
- W3094497118 modified "2023-09-24" @default.
- W3094497118 title "Impact of Channel Hot-Hole Stressing on Gate-Oxide Trap’s Emission" @default.
- W3094497118 cites W1541920164 @default.
- W3094497118 cites W1604552185 @default.
- W3094497118 cites W1761051592 @default.
- W3094497118 cites W1968702808 @default.
- W3094497118 cites W1979243431 @default.
- W3094497118 cites W1983292814 @default.
- W3094497118 cites W1988922865 @default.
- W3094497118 cites W2010617157 @default.
- W3094497118 cites W2010906761 @default.
- W3094497118 cites W2011907104 @default.
- W3094497118 cites W2016565894 @default.
- W3094497118 cites W2026785404 @default.
- W3094497118 cites W2030228054 @default.
- W3094497118 cites W2037409131 @default.
- W3094497118 cites W2046506400 @default.
- W3094497118 cites W2047637503 @default.
- W3094497118 cites W2054441649 @default.
- W3094497118 cites W2057593019 @default.
- W3094497118 cites W2058444582 @default.
- W3094497118 cites W2066881793 @default.
- W3094497118 cites W2076739848 @default.
- W3094497118 cites W2078763969 @default.
- W3094497118 cites W2085698034 @default.
- W3094497118 cites W2086712316 @default.
- W3094497118 cites W2094634280 @default.
- W3094497118 cites W2110391381 @default.
- W3094497118 cites W2117894590 @default.
- W3094497118 cites W2121692766 @default.
- W3094497118 cites W2125298814 @default.
- W3094497118 cites W2140390681 @default.
- W3094497118 cites W2151860561 @default.
- W3094497118 cites W2153710771 @default.
- W3094497118 cites W2157041258 @default.
- W3094497118 cites W2157180100 @default.
- W3094497118 cites W2158823012 @default.
- W3094497118 cites W2171853149 @default.
- W3094497118 cites W2327471595 @default.
- W3094497118 cites W2468016554 @default.
- W3094497118 cites W2527586943 @default.
- W3094497118 cites W2621035395 @default.
- W3094497118 cites W2621312956 @default.
- W3094497118 cites W2785433663 @default.
- W3094497118 cites W2797124026 @default.
- W3094497118 cites W2801985926 @default.
- W3094497118 cites W2898241664 @default.
- W3094497118 cites W2946128468 @default.
- W3094497118 cites W2999288368 @default.
- W3094497118 doi "https://doi.org/10.1109/ted.2020.3019982" @default.
- W3094497118 hasPublicationYear "2020" @default.
- W3094497118 type Work @default.
- W3094497118 sameAs 3094497118 @default.
- W3094497118 citedByCount "1" @default.
- W3094497118 countsByYear W30944971182022 @default.
- W3094497118 crossrefType "journal-article" @default.
- W3094497118 hasAuthorship W3094497118A5003039060 @default.
- W3094497118 hasAuthorship W3094497118A5068456167 @default.
- W3094497118 hasAuthorship W3094497118A5088326953 @default.
- W3094497118 hasConcept C119599485 @default.
- W3094497118 hasConcept C121099081 @default.
- W3094497118 hasConcept C121332964 @default.
- W3094497118 hasConcept C127162648 @default.
- W3094497118 hasConcept C127413603 @default.
- W3094497118 hasConcept C138885662 @default.
- W3094497118 hasConcept C153294291 @default.
- W3094497118 hasConcept C165801399 @default.
- W3094497118 hasConcept C171291426 @default.
- W3094497118 hasConcept C172385210 @default.
- W3094497118 hasConcept C191897082 @default.
- W3094497118 hasConcept C192562407 @default.
- W3094497118 hasConcept C195370968 @default.
- W3094497118 hasConcept C21036866 @default.
- W3094497118 hasConcept C2361726 @default.
- W3094497118 hasConcept C2778413303 @default.
- W3094497118 hasConcept C2779851234 @default.
- W3094497118 hasConcept C41895202 @default.
- W3094497118 hasConcept C49040817 @default.
- W3094497118 hasConcept C62520636 @default.
- W3094497118 hasConceptScore W3094497118C119599485 @default.
- W3094497118 hasConceptScore W3094497118C121099081 @default.
- W3094497118 hasConceptScore W3094497118C121332964 @default.
- W3094497118 hasConceptScore W3094497118C127162648 @default.
- W3094497118 hasConceptScore W3094497118C127413603 @default.
- W3094497118 hasConceptScore W3094497118C138885662 @default.
- W3094497118 hasConceptScore W3094497118C153294291 @default.
- W3094497118 hasConceptScore W3094497118C165801399 @default.
- W3094497118 hasConceptScore W3094497118C171291426 @default.
- W3094497118 hasConceptScore W3094497118C172385210 @default.
- W3094497118 hasConceptScore W3094497118C191897082 @default.
- W3094497118 hasConceptScore W3094497118C192562407 @default.
- W3094497118 hasConceptScore W3094497118C195370968 @default.
- W3094497118 hasConceptScore W3094497118C21036866 @default.
- W3094497118 hasConceptScore W3094497118C2361726 @default.