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• W3100103862 abstract "The accuracy of contact resistance values of two-dimensional field-effect transistors extracted with the textit{Y}-function considering the impact of the intrinsic mobility degradation is evaluated here. The difference between methodologies that take this factor into account and ignore it is pointed out by a detailed analysis of the approximations of the transport model used for each extraction. In contrast to the oftenly used approach where the intrinsic mobility degradation is neglected, a textit{Y}-function-based method considering a more complete transport model yields contact resistance values similar to reference values obtained by other intricate approaches. The latter values are more suitable also to describe experimental data of two dimensional devices of different technologies. The intrinsic mobility degradation factor of two-dimensional transistors is experimentally characterized for the first time and its impact on the device performance is described and evaluated." @default.
• W3100103862 created "2020-11-23" @default.
• W3100103862 creator A5048994032 @default.
• W3100103862 creator A5050593788 @default.
• W3100103862 date "2020-09-03" @default.
• W3100103862 modified "2023-10-06" @default.
• W3100103862 title "Accuracy of Y-function methods for parameters extraction of two-dimensional FETs across different technologies" @default.
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• W3100103862 doi "https://doi.org/10.1049/el.2020.1502" @default.
• W3100103862 hasPublicationYear "2020" @default.
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