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• W3100481331 startingPage "P06023" @default.
• W3100481331 abstract "Effects of Single Event Upsets (SEU) and Single Event Transients (SET) are studied in the FE-I4B chip of the innermost layer of the ATLAS pixel system. SEU/SET affect the FE-I4B Global Registers as well as the settings for the individual pixels, causing, among other things, occupancy losses, drops in the low voltage currents, noisy pixels, and silent pixels. Quantitative data analysis and simulations indicate that SET dominate over SEU on the load line of the memory. Operational issues and mitigation techniques are presented." @default.
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• W3100481331 date "2020-06-17" @default.
• W3100481331 modified "2023-10-13" @default.
• W3100481331 title "Measurements of Single Event Upset in ATLAS IBL" @default.
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• W3100481331 doi "https://doi.org/10.1088/1748-0221/15/06/p06023" @default.
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