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• W3100885724 endingPage "096101" @default.
• W3100885724 startingPage "096101" @default.
• W3100885724 abstract "The total dose radiation and annealing responses of the back transistor of Silicon-On-Insulator (SOI) pMOSFETs have been studied by comparing with those of the back transistor of SOI nMOSFETs fabricated on the same wafer. The transistors were irradiated by 60Co {gamma}-rays with various doses, and the front transistors are biased in a Float-State and Off-State, respectively, during irradiation. The total dose radiation responses of the back transistors are characterized by their threshold voltage shifts. The results show that the total dose radiation response of the back transistor of SOI pMOSFETs, similar to that of SOI nMOSFETs, depends greatly on their bias conditions during irradiation. However, with the Float-State bias, rather than the Off-State bias, the back transistors of SOI pMOSFETs reveal a much higher sensitivity to total dose radiation, which is contrary to those of SOI nMOSFETs. In addition, it is also found that the total dose radiation effect of the back transistor of SOI pMOSFETs irradiated with Off-State bias, as well as that of the SOI nMOSFETs, exhibits an increasing trend as the channel length decreases. The annealing response of the back transistors after irradiation at room temperature without bias, characterized by their threshold voltage shifts, indicates that there is a relatively complex annealing mechanism associated with channel length and type, bias condition during irradiation. In particular, for all the transistors irradiated with Off-State bias, their back transistors show an abnormal annealing effect during early annealing. All the results have been discussed and analyzed in detail by the aid of simulation." @default.
• W3100885724 created "2020-11-23" @default.
• W3100885724 creator A5038383323 @default.
• W3100885724 creator A5065842343 @default.
• W3100885724 creator A5072709871 @default.
• W3100885724 creator A5082743174 @default.
• W3100885724 creator A5088254866 @default.
• W3100885724 date "2015-09-01" @default.
• W3100885724 modified "2023-09-24" @default.
• W3100885724 title "Total dose radiation and annealing responses of the back transistor of Silicon-On-Insulator pMOSFETs" @default.
• W3100885724 cites W1966861596 @default.
• W3100885724 cites W2007297276 @default.
• W3100885724 cites W2018484812 @default.
• W3100885724 cites W2027477504 @default.
• W3100885724 cites W2038172248 @default.
• W3100885724 cites W2059214545 @default.
• W3100885724 cites W2089005840 @default.
• W3100885724 cites W2090413233 @default.
• W3100885724 cites W2095908314 @default.
• W3100885724 cites W2097309673 @default.
• W3100885724 cites W2105180128 @default.
• W3100885724 cites W2116996412 @default.
• W3100885724 cites W2141494023 @default.
• W3100885724 cites W2142900883 @default.
• W3100885724 cites W2145809257 @default.
• W3100885724 cites W2150849386 @default.
• W3100885724 cites W2171507225 @default.
• W3100885724 doi "https://doi.org/10.1088/1674-1137/39/9/096101" @default.
• W3100885724 hasPublicationYear "2015" @default.
• W3100885724 type Work @default.
• W3100885724 sameAs 3100885724 @default.
• W3100885724 citedByCount "2" @default.
• W3100885724 countsByYear W31008857242018 @default.
• W3100885724 countsByYear W31008857242019 @default.
• W3100885724 crossrefType "journal-article" @default.
• W3100885724 hasAuthorship W3100885724A5038383323 @default.
• W3100885724 hasAuthorship W3100885724A5065842343 @default.
• W3100885724 hasAuthorship W3100885724A5072709871 @default.
• W3100885724 hasAuthorship W3100885724A5082743174 @default.
• W3100885724 hasAuthorship W3100885724A5088254866 @default.
• W3100885724 hasBestOaLocation W31008857242 @default.
• W3100885724 hasConcept C111337013 @default.
• W3100885724 hasConcept C119599485 @default.
• W3100885724 hasConcept C120665830 @default.
• W3100885724 hasConcept C121332964 @default.
• W3100885724 hasConcept C127413603 @default.
• W3100885724 hasConcept C153385146 @default.
• W3100885724 hasConcept C159985019 @default.
• W3100885724 hasConcept C160671074 @default.
• W3100885724 hasConcept C165801399 @default.
• W3100885724 hasConcept C172385210 @default.
• W3100885724 hasConcept C185544564 @default.
• W3100885724 hasConcept C192562407 @default.
• W3100885724 hasConcept C195370968 @default.
• W3100885724 hasConcept C2777855556 @default.
• W3100885724 hasConcept C2778413303 @default.
• W3100885724 hasConcept C49040817 @default.
• W3100885724 hasConcept C53143962 @default.
• W3100885724 hasConcept C544956773 @default.
• W3100885724 hasConceptScore W3100885724C111337013 @default.
• W3100885724 hasConceptScore W3100885724C119599485 @default.
• W3100885724 hasConceptScore W3100885724C120665830 @default.
• W3100885724 hasConceptScore W3100885724C121332964 @default.
• W3100885724 hasConceptScore W3100885724C127413603 @default.
• W3100885724 hasConceptScore W3100885724C153385146 @default.
• W3100885724 hasConceptScore W3100885724C159985019 @default.
• W3100885724 hasConceptScore W3100885724C160671074 @default.
• W3100885724 hasConceptScore W3100885724C165801399 @default.
• W3100885724 hasConceptScore W3100885724C172385210 @default.
• W3100885724 hasConceptScore W3100885724C185544564 @default.
• W3100885724 hasConceptScore W3100885724C192562407 @default.
• W3100885724 hasConceptScore W3100885724C195370968 @default.
• W3100885724 hasConceptScore W3100885724C2777855556 @default.
• W3100885724 hasConceptScore W3100885724C2778413303 @default.
• W3100885724 hasConceptScore W3100885724C49040817 @default.
• W3100885724 hasConceptScore W3100885724C53143962 @default.
• W3100885724 hasConceptScore W3100885724C544956773 @default.
• W3100885724 hasIssue "9" @default.
• W3100885724 hasLocation W31008857241 @default.
• W3100885724 hasLocation W31008857242 @default.
• W3100885724 hasOpenAccess W3100885724 @default.
• W3100885724 hasPrimaryLocation W31008857241 @default.
• W3100885724 hasRelatedWork W1615449587 @default.
• W3100885724 hasRelatedWork W2025064305 @default.
• W3100885724 hasRelatedWork W2052487808 @default.
• W3100885724 hasRelatedWork W2258518458 @default.
• W3100885724 hasRelatedWork W2360387095 @default.
• W3100885724 hasRelatedWork W2515651426 @default.
• W3100885724 hasRelatedWork W2530565886 @default.
• W3100885724 hasRelatedWork W2538475065 @default.
• W3100885724 hasRelatedWork W2539474879 @default.
• W3100885724 hasRelatedWork W2588752855 @default.
• W3100885724 hasRelatedWork W2614929 @default.
• W3100885724 hasRelatedWork W2745281798 @default.
• W3100885724 hasRelatedWork W2887903071 @default.
• W3100885724 hasRelatedWork W2897420165 @default.
• W3100885724 hasRelatedWork W2899450949 @default.
• W3100885724 hasRelatedWork W2951786666 @default.

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