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• W3100903073 abstract "Cross-sectional submicronic Laue diffraction has been successfully applied to HgCdTe/CdZnTe heterostructures to provide accurate strain profiles from substrate to surface. Combined with chemical-sensitive techniques, this approach allows correlation of lattice-mismatch, interface compositional gradient and strain while isolating specific layer contributions which would otherwise be averaged using conventional X-ray diffraction. The submicronic spatial resolution allowed by the synchrotron white beam size is particularly suited to complex infrared detector designed structures such as dual-color detectors. The extreme strain resolution of 10 −5 required for the very low lattice-mismatch system HgCdTe/CdZnTe is demonstrated." @default.
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• W3100903073 date "2021-01-01" @default.
• W3100903073 modified "2023-09-25" @default.
• W3100903073 title "Submicronic Laue diffraction to determine in-depth strain in very closely matched complex HgCdTe/CdZnTe heterostructures with a 10⁻⁵ resolution" @default.
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• W3100903073 doi "https://doi.org/10.1107/s1600577520013211" @default.
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