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- W3100951210 abstract "Techniques for scanning probe microscopy based on electrostatic forces have revealed the fates of charges in a broad array of semiconductor electronic and photovoltaic devices. Recent experiments, however, have called into question the equations widely used to describe these experiments. To remedy this situation, the authors conduct a rigorous analysis of the coupled electromechanical motion of cantilever position, cantilever charge, and sample charge during an electrostatic force microscope experiment. Their results should inspire researchers to rethink such experiments, and reconsider what the resulting data are telling them about charge motion in their materials." @default.
- W3100951210 created "2020-11-23" @default.
- W3100951210 creator A5039708409 @default.
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- W3100951210 date "2019-06-10" @default.
- W3100951210 modified "2023-09-23" @default.
- W3100951210 title "Lagrangian and Impedance-Spectroscopy Treatments of Electric Force Microscopy" @default.
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- W3100951210 doi "https://doi.org/10.1103/physrevapplied.11.064020" @default.
- W3100951210 hasPublicationYear "2019" @default.
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