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• W3100992854 abstract "High-resolution X-ray photoemission electron microscopy (X-PEEM) is a well-established method for imaging ferroelectric domain structures. Here, we expand the scope of application of X-PEEM and demonstrate its capability for imaging and investigating domain walls in ferroelectrics with high spatial resolution. Using ErMnO3 as test system, we show that ferroelectric domain walls can be visualized based on photo-induced charging effects and local variations in their electronic conductance can be mapped by analyzing the energy distribution of photoelectrons. Our results open the door for non-destructive, contact-free, and element-specific studies of the electronic and chemical structure at domain walls in ferroelectrics." @default.
• W3100992854 created "2020-11-23" @default.
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• W3100992854 date "2014-06-09" @default.
• W3100992854 modified "2023-10-18" @default.
• W3100992854 title "Imaging and characterization of conducting ferroelectric domain walls by photoemission electron microscopy" @default.
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• W3100992854 doi "https://doi.org/10.1063/1.4879260" @default.
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