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• W3105472009 abstract "In this paper, a method is presented to create and characterize mechanically robust, free standing, ultrathin, oxide films with controlled, nanometer-scale thickness using Atomic Layer Deposition (ALD) on graphene. Aluminum oxide films were deposited onto suspended graphene membranes using ALD. Subsequent etching of the graphene left pure aluminum oxide films only a few atoms in thickness. A pressurized blister test was used to determine that these ultrathin films have a Young's modulus of 154 pm 13 GPa. This Young's modulus is comparable to much thicker alumina ALD films. This behavior indicates that these ultrathin two-dimensional films have excellent mechanical integrity. The films are also impermeable to standard gases suggesting they are pinhole-free. These continuous ultrathin films are expected to enable new applications in fields such as thin film coatings, membranes and flexible electronics." @default.
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• W3105472009 date "2012-06-22" @default.
• W3105472009 modified "2023-09-27" @default.
• W3105472009 title "Ultrathin Oxide Films by Atomic Layer Deposition on Graphene" @default.
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• W3105472009 doi "https://doi.org/10.1021/nl3014956" @default.
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