Matches in SemOpenAlex for { <https://semopenalex.org/work/W3115505106> ?p ?o ?g. }
Showing items 1 to 52 of
52
with 100 items per page.
- W3115505106 abstract "Abstract This paper describes a new technique for measuring junction temperature with high accuracy in accelerated operational tests (junction temperature ≥200°C) based on the measurements of temperature dependence of gate-leakage current on a GaAs FET (gate-leakage method). The gate-leakage current on the GaAs FET is monitored in the accelerated operational tests. Then, junction temperature and thermal resistance are calculated from the temperature dependence of the gate-leakage current, especially from the temperature dependence in high temperature region. We have measured the junction temperature and the thermal resistance using this method in accelerated operational tests, and have confirmed that the junction temperature can be estimated within a range of ten degrees. The results by this method have been compared with data of simulation, and the validity has been confirmed." @default.
- W3115505106 created "2021-01-05" @default.
- W3115505106 creator A5024802524 @default.
- W3115505106 creator A5051442438 @default.
- W3115505106 creator A5082631029 @default.
- W3115505106 date "1999-10-01" @default.
- W3115505106 modified "2023-09-23" @default.
- W3115505106 title "A Technique for Measuring Device Temperature with High Accuracy in Accelerated Operational Life Tests" @default.
- W3115505106 doi "https://doi.org/10.31399/asm.cp.istfa1999p0183" @default.
- W3115505106 hasPublicationYear "1999" @default.
- W3115505106 type Work @default.
- W3115505106 sameAs 3115505106 @default.
- W3115505106 citedByCount "0" @default.
- W3115505106 crossrefType "proceedings-article" @default.
- W3115505106 hasAuthorship W3115505106A5024802524 @default.
- W3115505106 hasAuthorship W3115505106A5051442438 @default.
- W3115505106 hasAuthorship W3115505106A5082631029 @default.
- W3115505106 hasConcept C127413603 @default.
- W3115505106 hasConcept C200601418 @default.
- W3115505106 hasConcept C39432304 @default.
- W3115505106 hasConcept C41008148 @default.
- W3115505106 hasConceptScore W3115505106C127413603 @default.
- W3115505106 hasConceptScore W3115505106C200601418 @default.
- W3115505106 hasConceptScore W3115505106C39432304 @default.
- W3115505106 hasConceptScore W3115505106C41008148 @default.
- W3115505106 hasLocation W31155051061 @default.
- W3115505106 hasOpenAccess W3115505106 @default.
- W3115505106 hasPrimaryLocation W31155051061 @default.
- W3115505106 hasRelatedWork W1998123932 @default.
- W3115505106 hasRelatedWork W2044019053 @default.
- W3115505106 hasRelatedWork W2117430304 @default.
- W3115505106 hasRelatedWork W2154144101 @default.
- W3115505106 hasRelatedWork W2160232784 @default.
- W3115505106 hasRelatedWork W2169470671 @default.
- W3115505106 hasRelatedWork W2357296690 @default.
- W3115505106 hasRelatedWork W2357762119 @default.
- W3115505106 hasRelatedWork W2378809595 @default.
- W3115505106 hasRelatedWork W2390229384 @default.
- W3115505106 hasRelatedWork W2907410728 @default.
- W3115505106 hasRelatedWork W3111311952 @default.
- W3115505106 hasRelatedWork W2401630293 @default.
- W3115505106 hasRelatedWork W2599167867 @default.
- W3115505106 hasRelatedWork W2814201362 @default.
- W3115505106 hasRelatedWork W2841200749 @default.
- W3115505106 hasRelatedWork W2925763242 @default.
- W3115505106 hasRelatedWork W2927609460 @default.
- W3115505106 hasRelatedWork W2929803655 @default.
- W3115505106 hasRelatedWork W3089977811 @default.
- W3115505106 isParatext "false" @default.
- W3115505106 isRetracted "false" @default.
- W3115505106 magId "3115505106" @default.
- W3115505106 workType "article" @default.