FRINK Linked Data Fragments server

Matches in SemOpenAlex for { <https://semopenalex.org/work/W3116396087> ?p ?o ?g. }

• W3116396087 endingPage "237803" @default.
• W3116396087 startingPage "237803" @default.
• W3116396087 abstract "Ferroelectric random access memory (FRAM) is a promising memory for space application. The performance of FRAM under irradiation environment should be investigated, especially under proton irradiation environment, which dominates the particles in the space environment. The experiments on single event effects are carried out for two types of FRAMs (FM22L16 and FM28 V100) based on the proton cyclotron of China institute of atomic energy. Both dynamic and static mode are tested for each chip under the irradiation of proton in an energy range from 30 MeV to 90 MeV. Single event upsets (SEUs) and single event functional interrupts (SEFIs) are observed only on FM22L16, where the SEFI is recorded as a significantly transient error with or without memory cell upsets. The SEFI can be subdivided into soft SEFI and hard SEFI according to whether those significantly transient errors disappear or not when the irradiation is paused. Single event effect performances of FM22L16 are accurately described, and the SEFI cross section in an energy range from 50 MeV to 90 MeV is obtained experimentally. The cross section of SEFI increases with proton energy increasing and reaches 10^-3/cm² at 90 MeV. To further study the mechanism of SEFI, the pulsed laser beam with a wavelength of 1064 nm is used to pinpoint the sensitive area of SEFI in the FRAM. Pulsed laser experiment is easy to carry out when single pulsed laser radiates on the device from the back side. Results show that a certain part in peripheral circuit is detected as a sensitive area to SEFI. The sensitive area could be a register or buffer which is vulnerable to irradiation. Only SEUs are observed when the pulsed laser radiates others area of peripheral circuit and memory cell. A hypothesis that a micro latch-up in the CMOS-based peripheral circuit leads to the SEFI is proposed to explain the test results, for the CMOS-based peripheral circuit is sensitive to irradiation. The further reason is the energy deposition in silicon substrate by protons with energies ranging from 30 MeV to 90 MeV through nuclear reaction, which triggers the silicon controlled rectifier structure in the FRAM peripheral circuit. According to the hypothesis, a transient current should be generated in the peripheral circuit when the micro latch-up happens. The transient current is observed on the output of device by using a high frequency oscilloscope which demonstrates the reasonability of the hypothesis." @default.
• W3116396087 created "2021-01-05" @default.
• W3116396087 creator A5001159193 @default.
• W3116396087 creator A5011336568 @default.
• W3116396087 creator A5020733982 @default.
• W3116396087 creator A5021700686 @default.
• W3116396087 creator A5041896320 @default.
• W3116396087 creator A5042590059 @default.
• W3116396087 creator A5062409995 @default.
• W3116396087 creator A5063687683 @default.
• W3116396087 creator A5075080019 @default.
• W3116396087 creator A5076539606 @default.
• W3116396087 date "2018-01-01" @default.
• W3116396087 modified "2023-09-26" @default.
• W3116396087 title "Experimental study about single event functional interrupt of ferroelectric random access memory induced by 30-90 MeV proton" @default.
• W3116396087 cites W1970759859 @default.
• W3116396087 cites W2056721615 @default.
• W3116396087 cites W2611474232 @default.
• W3116396087 cites W2753652322 @default.
• W3116396087 cites W2765640558 @default.
• W3116396087 cites W2797500530 @default.
• W3116396087 cites W2801791899 @default.
• W3116396087 doi "https://doi.org/10.7498/aps.67.20181225" @default.
• W3116396087 hasPublicationYear "2018" @default.
• W3116396087 type Work @default.
• W3116396087 sameAs 3116396087 @default.
• W3116396087 citedByCount "2" @default.
• W3116396087 countsByYear W31163960872019 @default.
• W3116396087 countsByYear W31163960872022 @default.
• W3116396087 crossrefType "journal-article" @default.
• W3116396087 hasAuthorship W3116396087A5001159193 @default.
• W3116396087 hasAuthorship W3116396087A5011336568 @default.
• W3116396087 hasAuthorship W3116396087A5020733982 @default.
• W3116396087 hasAuthorship W3116396087A5021700686 @default.
• W3116396087 hasAuthorship W3116396087A5041896320 @default.
• W3116396087 hasAuthorship W3116396087A5042590059 @default.
• W3116396087 hasAuthorship W3116396087A5062409995 @default.
• W3116396087 hasAuthorship W3116396087A5063687683 @default.
• W3116396087 hasAuthorship W3116396087A5075080019 @default.
• W3116396087 hasAuthorship W3116396087A5076539606 @default.
• W3116396087 hasBestOaLocation W31163960871 @default.
• W3116396087 hasConcept C111337013 @default.
• W3116396087 hasConcept C121332964 @default.
• W3116396087 hasConcept C159985019 @default.
• W3116396087 hasConcept C184779094 @default.
• W3116396087 hasConcept C185544564 @default.
• W3116396087 hasConcept C186370098 @default.
• W3116396087 hasConcept C192562407 @default.
• W3116396087 hasConcept C204323151 @default.
• W3116396087 hasConcept C2779662365 @default.
• W3116396087 hasConcept C2780073065 @default.
• W3116396087 hasConcept C39527238 @default.
• W3116396087 hasConcept C41008148 @default.
• W3116396087 hasConcept C44870925 @default.
• W3116396087 hasConcept C54516573 @default.
• W3116396087 hasConcept C62520636 @default.
• W3116396087 hasConcept C68043766 @default.
• W3116396087 hasConcept C82706917 @default.
• W3116396087 hasConcept C9390403 @default.
• W3116396087 hasConceptScore W3116396087C111337013 @default.
• W3116396087 hasConceptScore W3116396087C121332964 @default.
• W3116396087 hasConceptScore W3116396087C159985019 @default.
• W3116396087 hasConceptScore W3116396087C184779094 @default.
• W3116396087 hasConceptScore W3116396087C185544564 @default.
• W3116396087 hasConceptScore W3116396087C186370098 @default.
• W3116396087 hasConceptScore W3116396087C192562407 @default.
• W3116396087 hasConceptScore W3116396087C204323151 @default.
• W3116396087 hasConceptScore W3116396087C2779662365 @default.
• W3116396087 hasConceptScore W3116396087C2780073065 @default.
• W3116396087 hasConceptScore W3116396087C39527238 @default.
• W3116396087 hasConceptScore W3116396087C41008148 @default.
• W3116396087 hasConceptScore W3116396087C44870925 @default.
• W3116396087 hasConceptScore W3116396087C54516573 @default.
• W3116396087 hasConceptScore W3116396087C62520636 @default.
• W3116396087 hasConceptScore W3116396087C68043766 @default.
• W3116396087 hasConceptScore W3116396087C82706917 @default.
• W3116396087 hasConceptScore W3116396087C9390403 @default.
• W3116396087 hasIssue "23" @default.
• W3116396087 hasLocation W31163960871 @default.
• W3116396087 hasOpenAccess W3116396087 @default.
• W3116396087 hasPrimaryLocation W31163960871 @default.
• W3116396087 hasRelatedWork W1574325095 @default.
• W3116396087 hasRelatedWork W1963689591 @default.
• W3116396087 hasRelatedWork W1990669079 @default.
• W3116396087 hasRelatedWork W1999383646 @default.
• W3116396087 hasRelatedWork W2046741333 @default.
• W3116396087 hasRelatedWork W2081318574 @default.
• W3116396087 hasRelatedWork W2083338355 @default.
• W3116396087 hasRelatedWork W2148632381 @default.
• W3116396087 hasRelatedWork W2237639268 @default.
• W3116396087 hasRelatedWork W2389209173 @default.
• W3116396087 hasVolume "67" @default.
• W3116396087 isParatext "false" @default.
• W3116396087 isRetracted "false" @default.
• W3116396087 magId "3116396087" @default.
• W3116396087 workType "article" @default.