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- W3119989063 abstract "Low ohm Thick film resistors are most widely used to make surge protection networks for telecommunication to protect network equipment against lightning surge voltages. The thick film resistors are subjected to overstress conditions at the time of lightning. The overstress conditions occur due to the transient voltage pulses such as Electrical Fast Transients (EFT) conducted and radiated from power switching, surges to KV levels due to lightning and heavy power cross conditions. Several standard test procedures such as IEC 1000-41, ANSI C63 and IEEE C62.41 have been set up to determine the reliability of electronic circuitry subjected to overstress conditions. The resistance values of thick film resistors should be stable when subjected to transient voltage surges in order to achieve reliable electronic circuitry under voltage stress conditions. This paper describes the overstress characterization of thick film resistors for surge protection devices for telecommunications. This paper also describes Ferro's thick film resistor system for surge protection application and its stability under applied electrical stress. The effect of design parameters such as, line width and line spacing of the resistor on the stability of thick film resistors under voltage overstress conditions is discussed in this paper. The resistors were overglazed with different types of overglazes for environmental protection. The type of overglazing and its effect on the surge handling characteristics of low ohm thick film resistor is discussed. The stability of the overglazes under humidity bias testing condition is also presented." @default.
- W3119989063 created "2021-01-18" @default.
- W3119989063 creator A5089181424 @default.
- W3119989063 date "1997-01-01" @default.
- W3119989063 modified "2023-09-28" @default.
- W3119989063 title "Effect of Design Parameters on Overstress Characterization of Thick Film Resistors for Lightning Surge Protection" @default.
- W3119989063 hasPublicationYear "1997" @default.
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