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• W3128367110 abstract "The various advantages of extended-source (ES), broken gate (BG), and hetero-gate-dielectric (HGD) technology are blended together for the proposed tunnel field-effect transistor (ESBG TFET) in order to enhance the direct-current and analog/radio-frequency performance. The source of the ESBG TFET is extended into channel for the purpose of increasing the point and line tunneling in the device at the tunneling junction, and then, the on-state current for the ESBG TFET increases. The influence of the source region length on the direct-current and radio-frequency performance parameters of the ESBG TFET is analyzed in detail. The results show that the proposed TFET exhibits a high on-state current to off-state current ratio of 10 13 , large transconductance of 1200 μS/μm, high cut-off frequency of 72.8 GHz, and high gain bandwidth product of 14.3 GHz. Apart from these parameters, the ESBG TFET also demonstrates high linearity distortion parameters in terms of the second- and third-order voltage intercept points, the third-order input interception point, and the third-order intermodulation distortion. Therefore, the ESBG TFET greatly promotes the application potential of conventional TFETs." @default.
• W3128367110 created "2021-02-15" @default.
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• W3128367110 date "2021-07-01" @default.
• W3128367110 modified "2023-10-18" @default.
• W3128367110 title "Extended-source broken gate tunnel FET for improving direct current and analog/radio-frequency performance*" @default.
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• W3128367110 doi "https://doi.org/10.1088/1674-1056/abe372" @default.
• W3128367110 hasPublicationYear "2021" @default.
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