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- W3132156914 abstract "Single event transient of a real p-n junction in a 0.18μm bulk process is studied by 3D TCAD simulation.The impact of voltage,temperature,substrate concentration,and LET on SET is studied.Our simulation results demonstrate that biases in the range 1.62 to 1.98V influence DSET current shape greatly and total collected charge weakly.Peak current and charge collection within 2ns decreases as temperature increases,and temperature has a stronger influence on SET currents than on total charge.Typical variation of substrate concentration in modern VDSM processes has a negligible effect on SEEs.Both peak current and total collection charge increases as LET increases." @default.
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- W3132156914 date "2008-09-03" @default.
- W3132156914 modified "2023-09-27" @default.
- W3132156914 title "Using 3D TCAD Simulation to Study Charge Collection of a p-n Junction in a 0.18μm Bulk Process" @default.
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