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- W3138434165 abstract "The paper considers the requirements for test benches for studying the appearance of single radiation effects in the electronic component base (ECB) at elevated and low temperatures. Examples of the influence of the temperature regime on the levels of ECB stability, as well as the influence of the passive and active modes of radio-electronic equipment on the occurrence of single events are presented." @default.
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- W3138434165 date "2021-03-20" @default.
- W3138434165 modified "2023-09-24" @default.
- W3138434165 title "Control of ECB tests depending on their operating conditions" @default.
- W3138434165 cites W2899933150 @default.
- W3138434165 doi "https://doi.org/10.12737/2219-0767-2021-14-1-22-27" @default.
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