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- W3143350524 abstract "Synchrotron X-ray nano computed tomography was used to investigate the microstructural evolution during co-sintering of multi-layer ceramic capacitors (MLCC) consisting of Ni electrodes and BaTiO3 dielectric layers stacked alternately. As the electrode thickness reduced to submicron at the scale of a few particle diameters, the process produced the defect of inner electrode leading to capacitance loss. The discontinuous electrode region contained round holes and irregularly-shaped channels. The formation of discontinuity was associated with the increase of characteristic length of heterogeneous electrode structure, i.e. the coarsening occurred. The evolution of electrode morphology by surface/interface diffusion caused the breakup of ligament between two holes driven by instability induced by surface tension and stress. The ligament pinch-off inevitably generated sharp points which might enhance the local electric field bringing about the dielectric breakdown. A model was presented to explain the formation of defect from the heterogeneous particles packing in the electrode layer." @default.
- W3143350524 created "2021-04-13" @default.
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- W3143350524 date "2020-01-01" @default.
- W3143350524 modified "2023-10-16" @default.
- W3143350524 title "Microstructural Evolution of Electrodes in Sintering of Multi-Layer Ceramic Capacitors (MlCC) Observed by Synchrotron X-Ray Nano-Ct" @default.
- W3143350524 doi "https://doi.org/10.2139/ssrn.3727660" @default.
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