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• W3144655711 abstract "Silicon microstrip detectors are widely used in experiments for space astronomy. Before the detector is assembled, extensive characterization of the silicon microstrip sensors is indispensable and challenging. This work electrically evaluates a series of sensor parameters, including the depletion voltage, bias resistance, metal strip resistance, total leakage current, strip leakage current, coupling capacitance, and interstrip capacitance. Two methods are used to accurately measure the strip leakage current, and the test results match each other well. In measuring the coupling capacitance, we extract the correct value based on a SPICE model and two-port network analysis. In addition, the expression of the measured bias resistance is deduced based on the SPICE model." @default.
• W3144655711 created "2021-04-13" @default.
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• W3144655711 date "2020-10-01" @default.
• W3144655711 modified "2023-09-27" @default.
• W3144655711 title "Characterization of silicon microstrip sensors for space astronomy" @default.
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• W3144655711 doi "https://doi.org/10.1007/s41365-020-00811-9" @default.
• W3144655711 hasPublicationYear "2020" @default.
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