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• W3145314308 abstract "This session brings together specialists from the DfT, DfY and DfR domains that will address key problems together with their solutions for the 14 nm node and beyond, dealing with extremely complex chips affected by high defect levels, unpredictable and heterogeneous timing behavior, circuit degradation over time, including extreme situations related with the ultimate CMOS nodes, where all processor nodes, routers and links of single-chip massively parallel tera-device processors could comprise timing faults (such as delay faults or clock skews); a large percentage of these parts are affected by catastrophic failures; all parts experience significant performance degradations over time; and new catastrophic failures occur at low MTBF." @default.
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• W3145314308 date "2012-03-01" @default.
• W3145314308 modified "2023-10-18" @default.
• W3145314308 title "Design for test and reliability in ultimate CMOS" @default.
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• W3145314308 doi "https://doi.org/10.1109/date.2012.6176556" @default.
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