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- W3146025941 abstract "The variation in environmental scattering background is a major source of systematic errors in X-ray inspection and measurement systems. As the energy of these photons consisting of environmental scattering background is much lower generally, the Cerenkov detectors having the detection threshold are likely insensitive to them and able to exclude their influence. A thickness measurement experiment is designed to verify the idea by employing a Cerenkov detector and an ionizing chamber for comparison. Furthermore, it is also found that the application of the Cerenkov detectors is helpful to exclude another systematic error from the variation of low energy components in the spectrum incident on the detector volume." @default.
- W3146025941 created "2021-04-13" @default.
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- W3146025941 date "2010-01-01" @default.
- W3146025941 modified "2023-09-25" @default.
- W3146025941 title "Employing a Cerenkov detector for the thickness measurement of X-rays in a scattering background" @default.
- W3146025941 hasPublicationYear "2010" @default.
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